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Infrared spectroscopy of Si(111) surfaces after HF treatment: Hydrogen termination and surface morphology
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Polarized internal reflection spectroscopy has been used to characterize HF-treated Si(111) surfaces as mentioned in this paper, and the silicon-hydrogen stretching vibrations indicate that the surface is well ordered, but is microscopically rough, with coupled monohydride, dihydride and trihydride termination.Abstract:
Polarized internal reflection spectroscopy has been used to characterize HF‐treated Si(111) surfaces. The silicon‐hydrogen stretching vibrations indicate that the surface is well ordered, but is microscopically rough, with coupled monohydride, dihydride, and trihydride termination.read more
Citations
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Ideal hydrogen termination of the Si (111) surface
TL;DR: In this article, the effect of varying the solution pH on the surface structure was studied by measuring the SiH stretch vibrations with infrared absorption spectroscopy, and the surface was found to be very homogeneous with low defect density (<0.5%) and narrow vibrational linewidth.
Journal ArticleDOI
Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in air
TL;DR: In this paper, the chemical modification of hydrogen-passivated n-Si surfaces by a scanning tunneling microscope (STM) operating in air is reported, and the modified surface regions have been characterized by STM spectroscopy, scanning electron microscopy (SEM), time-of-flight secondary ion mass spectrometry (TOF SIMS), and chemical etch/Nomarski microscopy.
Journal ArticleDOI
Comparison of Si(111) surfaces prepared using aqueous solutions of NH4F versus HF
TL;DR: In this article, the authors used vacuum scanning tunneling microscopy to investigate the hydrogen-terminated Si(111) surfaces obtained upon dissolution of the native oxide in HF and NH4F solutions.
Book
Porous Silicon in Practice: Preparation, Characterization and Applications
TL;DR: Porosity, Pore size, and pore size distribution in the x-y plane using physical or virtual masks were measured in this paper, showing that porosity and thickness of porosity can be measured using lift-off films of Porous Silicon.
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Atmospheric impregnation of porous silicon at room temperature
TL;DR: In this article, secondary ion mass spectroscopy (SIMS) analysis is used for the first time to simultaneously monitor all the major impurities on a surface of a Si surface.
References
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Book
AB INITIO Molecular Orbital Theory
TL;DR: In this paper, the use of theoretical models as an alternative to experiment in making accurate predictions of chemical phenomena is discussed, and the formulation of theoretical molecular orbital models starting from quantum mechanics is discussed.
Journal ArticleDOI
Internal Reflection Spectroscopy
N. J. Harrick,Joseph G. Hoffman +1 more
TL;DR: In this paper, it is shown that if the surface is flat and smooth, the nature of the reflection is called specular, i.e., mirror-like, and obeys the simple law that the angle of incidence equals the angles of reflection.
Journal ArticleDOI
Unusually low surface-recombination velocity on silicon and germanium surfaces.
TL;DR: It is found that a standard, widespread, chemical-preparation method for silicon, oxidation followed by an HF etch, results in a surface which from an electronic point of view is remarkably inactive, which has implications for the ultimate efficiency of silicon solar cells.
Journal ArticleDOI
Surface infrared spectroscopy
TL;DR: The theoretical and experimental foundation of surface IR spectroscopy is described and selected examples are presented to illustrate the kind of information derived in several important areas of surface science such as chemistry, structure, dynamics and kinetics at surfaces as discussed by the authors.