Journal ArticleDOI
Innovative Analysis of X‐ray Microdiffraction Images on Selected Applications of the Kossel Technique
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TLDR
In this paper, the informational content of Kossel interferences excited by electron and synchrotron radiation beams selected examples of microstructural applications, such as the precision determination of lattice constants, the precision determinations of crystallographic orientation of single grains, the determination of local stresses/strains and tetragonal distortions of cubic lattices including the description of a variety of methods for analysis are presented.Abstract:
Starting from the origin and the informational content of Kossel interferences excited by electron and synchrotron radiation beams selected examples of microstructural applications, such as the precision determination of lattice constants, the precision determination of crystallographic orientation of single grains, the determination of local stresses/strains and the determination of tetragonal distortions of cubic lattices including the description of a variety of methods for analysis are presented.read more
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Journal ArticleDOI
X-ray divergent-beam (Kossel) technique: A review
TL;DR: In this article, the development of the X-ray divergent-beam (Kossel) technique over the last 50 years is traced, and the fundamentals of this technique and ways to implement it experimentally are considered, and its potential for studying the real structure of crystals is analyzed in detail.
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Lattice constant determination from Kossel patterns observed by CCD camera
TL;DR: In this paper, the Kossel technique was used for lattice constant determination in micro ranges by use of X-ray films, and it was shown that it can be achieved at a Fe-crystal coming relatively close to the one of comparable Xray film patterns, which is still about one order of magnitude better for the time being.
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Measurements of residual stresses in micron regions by using synchrotron excited kossel diffraction
TL;DR: In this article, a new method to measure and determine the residual stresses in micron regions is discussed in detail, which is based on the KOSSEL effect and is used for the analysis of conductive and nonconductive materials.
Journal ArticleDOI
X‐ray Rotation‐Tilt‐Method — First Results of a new X‐ray Diffraction Technique
TL;DR: The XRT technique as discussed by the authors is a further special X-ray microdiffraction method where local Xray interferences are produced by directing an Xray or synchrotron beam from an external source with default monochromatic radiation of high intensity and a small diameter.
Journal ArticleDOI
Advances in X-ray excitation of Kossel patterns by a focusing polycapillary lens
TL;DR: In this paper, the polychromatic X-ray excitation of Kossel patterns by an Xray tube and a focusing polycapillary lens was presented, and it was shown that the lateral resolution of the Kossel technique can be improved and the exposure times can be strongly reduced by using a poly capillary lens.