J. Appl. Cryst.の発刊に際して
Citations
91 citations
Cites methods from "J. Appl. Cryst.の発刊に際して"
...In this report we will first describe the experiment and data processing, then present the results and finally apply modelling to quantify the variant selection and propose a plausible explanation....
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91 citations
90 citations
Cites background or methods from "J. Appl. Cryst.の発刊に際して"
...The silicon photodiode is such a device (Jach & Cowan, 1983; Krumrey et al., 2006; Alkire & Rotella, 1997)....
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...DE-AC03-76SF00098 at Lawrence Berkeley National Laboratory....
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...A comparison of various diodes of different types and thicknesses carried out both at the Advanced Light Source (ALS, Berkeley, USA) and the Swiss Light Source (SLS, Villigen, Switzerland) is presented here, as well as a model by which flux can most easily be quantified to enable accurate MX dose…...
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...The development of a model for determining the photon flux incident on pin diodes is described here, and has been tested on the macromolecular crystallography beamlines at both the Swiss Light Source, Villigen, Switzerland, and the Advanced Light Source, Berkeley, USA, at energies between 4 and 18 keV....
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...16, 143–151 doi:10.1107/S0909049508040429 143 Journal of Synchrotron Radiation ISSN 0909-0495 Received 2 September 2008 Accepted 26 November 2008 Determination of X-ray flux using silicon pin diodes Robin L. Owen,a‡2James M. Holton,b,c Clemens Schulze-Briesea and Elspeth F. Garmand* aSwiss Light Source, Paul Scherrer Institute, CH-5232 Villigen PSI, Switzerland, bDepartment of Biochemistry and Biophysics, University of California, San Francisco, CA 94158-2330, USA, cAdvanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA, and dLaboratory of Molecular Biophysics, Department of Biochemistry, University of Oxford, South Parks Road, Oxford OX1 3QU, UK....
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90 citations
Cites background from "J. Appl. Cryst.の発刊に際して"
...The work of Hundt et al. (2006) gives a comprehensive survey of existing methods and is focused on calculating some form of distance measure between structures....
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89 citations
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