Abstract: This paper is aimed at emulating the errors in semiconductor memories by space radiation with a pulsed laser that acts as an ion. A sensitivity map of the memory is performed identifying potential error areas and how many errors simultaneously occur.
Abstract: The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.
Abstract: This paper presents the EADS-CCR’s industrial laser test facility dedicated to the investigation of Single Event Effects. Applications to sensitivity precharacterisation of lntegrated Circuits are presented with a focus on SET tests of analog components.
Abstract: The Sensors and Electronic Instrumentation Group of the University Complutense of Madrid has developed a system to emulate the cosmic radiations effects on electronic devices by LASER irradiations. Of great interest to the nuclear industry and space electronics, this project was carried out partially supported by the company ALTER SPAIN S.A., specialized in engineering, quality management and testing of high reliability electronic components for space applications.
"Laser induced single events in SRAM..." refers background in this paper
...A more complete description of the laser can be found in ....