scispace - formally typeset
Search or ask a question
Book ChapterDOI

Lifetime Estimation of Insulated Gate Bipolar Transistor Modules Used for Industrial Application

01 Jan 2021-Vol. 700, pp 57-73
TL;DR: In this article, a simplified version of Coffin-Manson law along with rainflow algorithm has been used to develop analytical lifetime estimation method of IGBT modules for an application of washing machine.
Abstract: In the current industrial scenario, power modules are the most crucial electrical component used by any motor drive. Power modules are exposed to harsh environmental conditions. So, in order to design a reliable and high-quality product, lifetime estimation becomes a necessary task. In this paper, a simplified version of Coffin–Manson law along with rainflow algorithm has been used to develop analytical lifetime estimation method of IGBT modules. Load profile for an application of washing machine is taken into consideration. Direct torque control method of speed control has been used. Practical IGBT module has been electro-thermally modeled using PLECS toolbox. Finally, Palmgren-Miner law is used to sum up all the damages of fatigue cycles, and lifetime of the IGBT module FS150R12KT4 has been predicted.
References
More filters
01 Mar 2009

14,586 citations

Journal ArticleDOI
TL;DR: In this article, a questionnaire survey was carried out to determine the industrial requirements and expectations of reliability in power electronic converters, and the survey was subjective and conducted with a number of high-profile semiconductor manufacturers, integrators, and users in the aerospace, automation, motor drive, utility power, and other industry sectors.
Abstract: A questionnaire survey was carried out to determine the industrial requirements and expectations of reliability in power electronic converters. The survey was subjective and conducted with a number of high-profile semiconductor manufacturers, integrators, and users in the aerospace, automation, motor drive, utility power, and other industry sectors. According to the survey, power semiconductor devices ranked the most fragile components. It was concluded that main stresses were from the environment, transients, and heavy loads, which should be considered during power electronic system design and normal operation. This paper has also highlighted that there is a significant need identified by the responders for better reliability-monitoring methods and indicators.

1,558 citations