Local Electrode Atom Probe Tomography
01 Jan 2013-
TL;DR: Local electrode atom probe tomography as discussed by the authors is a well-known application in probability theory and applications in the field of optical systems engineering and has been widely used in the past few decades.
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TL;DR: In this paper, a NbTaTiV refractory HEA with a single body-centered-cubic (BCC) structure using an integrated experimental and theoretical approach was developed.
276 citations
Cites methods from "Local Electrode Atom Probe Tomograp..."
...For the APT observation, needle-shaped specimens were made, using standard lift-out methods with an FEI Nova focused ion beam (FIB) [44,45]....
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TL;DR: In this article, the phase-transformation behavior of maraging steels produced by selective laser melting (SLM) was investigated using atom-probe tomography (APT).
Abstract: Materials produced by selective laser melting (SLM) experience a thermal history that is markedly different from that encountered by conventionally produced materials. In particular, a very high cooling rate from the melt is combined with cyclical reheating upon deposition of subsequent layers. Using atom-probe tomography (APT), we investigated how this nonconventional thermal history influences the phase-transformation behavior of maraging steels (Fe–18Ni–9Co–3.4Mo–1.2Ti) produced by SLM. We found that despite the “intrinsic heat treatment” and the known propensity of maraging steels for rapid clustering and precipitation, the material does not show any sign of phase transformation in the as-produced state. Upon aging, three different types of precipitates, namely (Fe,Ni,Co)3(Ti,Mo), (Fe,Ni,Co)3(Mo,Ti), and (Fe,Ni,Co)7Mo6 (μ phase), were observed as well as martensite-to-austenite reversion around regions of the retained austenite. The concentration of the newly formed phases as quantified by APT closely matches thermodynamic equilibrium calculations.
212 citations
Cites methods from "Local Electrode Atom Probe Tomograp..."
...APT specimens were prepared from polished specimen surfaces in a FEI Helios NanoLab 600i FIB/SEM dual beam device (Hillsboro, OR), equipped with a micromanipulator using a conventional liftout technique.(23) Annular focused ion beam (FIB) milling was concluded with a final step at 5 kV acceleration voltage and 40 pA beam current to eliminate any Ga contamination at the specimen surface....
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TL;DR: In this article, the Intrinsic Heat Treatment (IHT) was exploited to induce the precipitation of NiAl nanoparticles in an Fe-19Ni-xAl (at%) model maraging steel, a system known for rapid clustering.
204 citations
Cites methods from "Local Electrode Atom Probe Tomograp..."
...APT samples were prepared by the Standard Lift-Out Process [46] in a FEI Helios NanoLab 600i FIB/SEM dual beam device, equipped with an Omniprobe micromanipulator....
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TL;DR: A Damascus-like steel consisting of alternating hard and soft layers is created by using a laser additive manufacturing technique and digital control of the processing parameters, showing superior mechanical properties to those of ancient Damascus steel.
Abstract: Laser additive manufacturing is attractive for the production of complex, three-dimensional parts from metallic powder using a computer-aided design model1–3 The approach enables the digital control of the processing parameters and thus the resulting alloy’s microstructure, for example, by using high cooling rates and cyclic re-heating4–10 We recently showed that this cyclic re-heating, the so-called intrinsic heat treatment, can trigger nickel-aluminium precipitation in an iron–nickel–aluminium alloy in situ during laser additive manufacturing9 Here we report a Fe19Ni5Ti (weight per cent) steel tailor-designed for laser additive manufacturing This steel is hardened in situ by nickel-titanium nanoprecipitation, and martensite is also formed in situ, starting at a readily accessible temperature of 200 degrees Celsius Local control of both the nanoprecipitation and the martensitic transformation during the fabrication leads to complex microstructure hierarchies across multiple length scales, from approximately 100-micrometre-thick layers down to nanoscale precipitates Inspired by ancient Damascus steels11–14—which have hard and soft layers, originally introduced via the folding and forging techniques of skilled blacksmiths—we produced a material consisting of alternating soft and hard layers Our material has a tensile strength of 1,300 megapascals and 10 per cent elongation, showing superior mechanical properties to those of ancient Damascus steel12 The principles of in situ precipitation strengthening and local microstructure control used here can be applied to a wide range of precipitation-hardened alloys and different additive manufacturing processes A Damascus-like steel consisting of alternating hard and soft layers is created by using a laser additive manufacturing technique and digital control of the processing parameters
202 citations
References
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TL;DR: Numerical methods matrices graphs and tables histograms and graphs computer routines in Pascal and Monte Carlo techniques dependent and independent variables least-squares fit to a polynomial least-square fit to an arbitrary function fitting composite peaks direct application of the maximum likelihood.
Abstract: Uncertainties in measurements probability distributions error analysis estimates of means and errors Monte Carlo techniques dependent and independent variables least-squares fit to a polynomial least-squares fit to an arbitrary function fitting composite peaks direct application of the maximum likelihood. Appendices: numerical methods matrices graphs and tables histograms and graphs computer routines in Pascal.
10,546 citations
"Local Electrode Atom Probe Tomograp..." refers background or methods in this paper
...For this example, k has a magnitude of about 5 [1] and has been found to increase with shank angle, α [17–19]....
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...The atom probe was invented in 1967 at the Pennsylvania State University by Müller, Panitz, and McLane [1] as a 1D analytical instrument that collected...
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...Müller, Panitz, and McLane [1] thus settled on measuring time of flight as the way to identify the ions visible in the FIM....
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...the specimen itself is also the image-forming “lens” and the imaging ion beams originate at the specimen surface” [1]....
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...The atom probe was invented in 1967 at the Pennsylvania State University by Müller, Panitz, and McLane [1] as a 1D analytical instrument that collected hundreds of atoms/day with approximately a one-nanometer field of view (FOV)....
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TL;DR: In the data for the 63 elements, trends that occur simultaneously in both the columns and the rows of the periodic table are shown to be useful in predicting correct values and also for identifying questionable data.
Abstract: A new compilation, based on a literature search for the period 1969–1976, is made of experimental data on the work function. For these 44 elements, preferred values are selected on the basis of valid experimental conditions. Older values, which are widely accepted, are given for 19 other elements on which there is no recent literature, and are so identified. In the data for the 63 elements, trends that occur simultaneously in both the columns and the rows of the periodic table are shown to be useful in predicting correct values and also for identifying questionable data. Several illustrative examples are given, including verifications of predictions published in 1950.
3,569 citations
"Local Electrode Atom Probe Tomograp..." refers background or methods in this paper
...9 SRIM [52] simulation of gallium ion implantation into silicon using (a) 30 keV and (b) 5 keV ions....
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...The evaporation field is typically a function of temperature [50] and sensitive to specimen composition [51] and crystalline orientation [52]....
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...For comparison, simulations of gallium ion implantation into silicon [52] using either 30 or 5 keV ions are shown in Fig....
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TL;DR: The current results demonstrate that specific regions of interest can be accessed and preserved throughout the sample-preparation process and that this preparation method leads to high-quality atom probe analysis of such nano-structures.
1,412 citations
Book•
17 Oct 2007
TL;DR: FinFETs and Other Multi-Gate Transistors provides a comprehensive description of the physics, technology and circuit applications of multigate field-effect transistors (FET) and explains the physics and properties.
Abstract: FinFETs and Other Multi-Gate Transistors provides a comprehensive description of the physics, technology and circuit applications of multigate field-effect transistors (FETs). It explains the physics and properties of these devices, how they are fabricated and how circuit designers can use them to improve the performances of integrated circuits. The International Technology Roadmap for Semiconductors (ITRS) recognizes the importance of these devices and places them in the "Advanced non-classical CMOS devices" category. Of all the existing multigate devices, the FinFET is the most widely known. FinFETs and Other Multi-Gate Transistors is dedicated to the different facets of multigate FET technology and is written by leading experts in the field.
843 citations
Book•
26 Aug 2012
TL;DR: In this paper, the authors present a detailed overview of the field ion microscopy (FIM) and its application in the field of materials science and engineering, as well as an analysis of the image in a pure material.
Abstract: Preface Acknowledgements List of Acronyms and Abbreviations List of Terms List of Non-SI Units and Constant Values PART I Fundamentals 1. Introduction 2. Field Ion Microscopy 2.1 Principles 2.1.1 Theory of field ionisation 2.1.2 'Seeing' atoms - field ion microscopy 2.1.3 Spatial resolution of the FIM 2.2 Instrumentation and Techniques for FIM 2.2.1 FIM instrumentation 2.2.2 eFIM or digital FIM 2.2.3 Tomographic FIM Techniques 2.3 Interpretation of FIM Images 2.3.1 Interpretation of the image in a pure material 2.3.2 Interpretation of the image for alloys 2.3.3 Selected applications of the FIM 2.3.4 Summary 3 From Field Desorption Microscopy to Atom Probe Tomography 3.1 Principles 3.1.1 Theory of field evaporation 3.1.2 'Analysing' atoms one-by-one: atom probe tomography 3.2 Instrumentation and Techniques for APT 3.2.1 Experimental setup 3.2.2 Field desorption microscopy 3.2.3 High voltage pulsing techniques 3.2.4 Laser pulsing techniques 3.2.5 Energy compensation techniques Part II Practical aspects 4. Specimen Preparation 4.1 Introduction 4.1.1 Sampling issues in microscopy for materials science and engineering 4.1.2 Specimen requirements 4.2 Polishing methods 4.2.1 The electropolishing process 4.2.2 Chemical polishing 4.2.3 Safety Considerations 4.2.4 Advantages and limitations 4.3 Broad ion beam techniques 4.4 Focused ion beam techniques 4.4.1 Cut-away methods 4.4.2 Lift-out methods 4.4.3 The final stages of FIB preparation 4.4.4 Understanding and minimising ion beam damage and other artefacts 4.5 Deposition methods 4.6 Methods for organic materials 4.6.1 Polymer microtips 4.6.2 Self-assembled monolayers 4.6.3 Cryopreparation 4.7 Other Methods 4.7.1 Dipping 4.7.2 Direct growth of suitable structures 4.8 Specimen geometry issues 4.8.1 Influence of specimen geometry on atom probe data 4.8.2 Stress states and specimen rupture 4.9 A guide to selecting an appropriate specimen preparation method 5. Experimental protocols in Field Ion Microscopy 5.1 Step-by-step procedures for FIM 5.2 Operational space of the field ion microscope 5.2.1 Imaging gas 5.2.2 Temperature 5.2.3 The best image field 5.2.4 Other parameters 5.2.5 Summary 6. Experimental protocols 6.1 Specimen alignment 6.2 Aspects of mass spectrometry 6.2.1 Detection of the ions 6.2.2 Mass spectra 6.2.3 Formation of the mass spectrum 6.2.4 Mass resolution 6.2.5 Common artefacts 6.2.6 Elemental identification 6.2.7 Measurement of the composition 6.2.8 Detectability 6.3 Operational space 6.3.1 Flight path 6.3.2 Temperature / Pulse fraction 6.3.3 Selecting the pulsing mode 6.3.4 Pulse rate 6.3.5 Detection rate 6.4 Specimen failure 6.5 Data quality assessment 6.5.1 Field desorption map 6.5.2 Mass spectrum 6.5.3 Multiple events 6.5.4 Discussion 7. Tomographic reconstruction 7.1 Projection of the ions 7.1.1 Estimation of the electric field 7.1.2 Field distribution 7.1.3 Ion trajectories 7.1.4 Point projection 7.1.5 Radial projection with angular compression 7.1.6 Discussion 7.2 Reconstruction 7.2.1 General considerations 7.2.2 Bas et al. protocol 7.2.3 Geiser et al. protocol 7.2.4 Gault et al. protocol 7.2.5 Reflectron-fitted instruments 7.2.6 Summary and discussion 7.3 Calibration of the parameters 7.3.2 Discussion 7.3.3 Limitations of the current procedure 7.4 Common artefacts 7.4.2 Correction of the reconstruction 7.5 Perspectives on the reconstruction in atom probe tomography 7.5.1 Advancing the reconstruction by correlative microscopy 7.5.2 In correlation with simulations 7.5.3 Alternative ways to exploit existing data 7.6 Spatial resolution in APT 7.6.1 Introduction 7.6.2 Means of investigation 7.6.3 Definition 7.6.4 On the in-depth resolution 7.6.5 On the lateral resolution 7.6.6 Optimisation of the spatial resolution 7.7 Lattice rectification PART III Applying atom probe techniques for materials science 8. Analysis techniques for atom probe tomography 8.1 Characterising the Mass Spectrum 8.1.1 Noise Reduction 8.1.2 Quantifying Peak Contributions via Isotope Natural Abundances 8.1.3 Spatially dependent identification of mass peaks 8.1.4 Multiple Detector Event Analyses 8.2 Characterising the chemical distribution 8.2.1 Quality of atom probe data 8.2.2 Random comparators 8.3 Grid-based counting statistics 8.3.1 Voxelisation 8.3.2 Density 8.3.3 Concentration analyses 8.3.4 Smoothing by delocalisation 8.3.5 Visualisation techniques based on iso-concentration and iso-density 8.3.6 One-dimensional profiles 8.3.7 Grid-based frequency distribution analyses 8.4 Techniques for describing atomic architecture 8.4.1 Nearest neighbour distributions 8.4.2 Cluster Identification Algorithms 8.4.3 Detection Efficiency Influence on Nanostructural Analyses 8.5 Radial Distribution 8.5.1 Radial distribution and pair correlation functions 8.5.2 Solute Short Range Order Parameters 8.6 Structural Analyses 8.6.1 Fourier Transforms for APT 8.6.2 Spatial Distribution Maps 8.6.3 Hough Transform 9. Atom probe microscopy and materials science 9.1 Compositional analysis 9.2 Defects/ dislocations 9.3 Solid solutions / clustering 9.4 Precipitates 9.5 Ordering reaction 9.6 Spinodal decomposition 9.7 Interface/boundaries/layers 9.8 Amorphous materials 9.9 Atom probe crystallography Appendices A. Appendix - chi2 distribution B. Appendix - Polishing chemicals and conditions C. File formats used in APT POS EPOS RNG RRNG ATO ENV PoSAP Cameca root files - RRAW, RHIT, ROOT D. Appendix - Image Hump Model Predictions E. Appendix - Essential Crystallography for APT Bravais lattices Notation Structure factor (F) rules for BCC, FCC, HCP Interplanar spacings (dhkl) Interplanar angles (phi) F. Stereographic Projections and commonly observed desorption maps Stereographic projection for the most commonly found structures and orientations Face-centred cubic Body-centred cubic Diamond cubic Hexagonal close-packed G. Periodic tables H. Kingham Curves I. List of elements and associated mass to charge ratios J. Possible element identity of peaks as a function of their location in the mass spectrum
739 citations
"Local Electrode Atom Probe Tomograp..." refers background or methods in this paper
...Standard methods were transferred from electron microscopy [2] and applied to metals (though not exclusively) beginning with the...
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...developed what he called the imaging atom probe (IAP) [2] in 1972, Fig....
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...General information on the techniques can be found in any reference book on the atom probe technique [3–9], and a large number of options for electropolishing and chemical polishing solutions may be found [2, 10]....
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..., size, shank angle, composition, reflectivity, absorption coefficient, thermal diffusivity, and band gap) influence how energy is absorbed, converted to heat, and removed from the apex region of the tip [2]....
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...precipitates and evaporation field of the matrix are ignored [1, 2, 23, 65]....
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