Low-frequency noise characterization, evaluation and modeling of advanced Si- and SiGe-based CMOS transistors
Citations
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523 citations
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Cites background from "Low-frequency noise characterizatio..."
...These sources are well discussed in the available literature [45], [46], [47]....
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...Handel, “Fundamental quantum 1/f noise in semiconductor devices Electron Devices“, IEEE Transactions on, Volume 41, Issue 11, Nov 1994 Page(s):2023 - 2033 [45] M....
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24 citations
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Additional excerpts
...The dash-dotted line shows the ITRS requirement on αH for the 45-nm technology node [48], [49]....
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20 citations
Cites background from "Low-frequency noise characterizatio..."
...Carrier number fluctuation and correlated mobility fluctuation are considered as the mechanism behind 1/f noise, which is widely supported by [9]–[12]....
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References
6,573 citations
5,711 citations
"Low-frequency noise characterizatio..." refers background in this paper
...Values from Wilk, Wallace and Anthony [58]....
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...From noise performance point of view it is worrying with the reports about degraded mobility [paper IV][59, 61-64] and high density of traps and fixed charges [papers IV and VII][58, 59, 65, 66]....
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...9, with a material with higher dielectric constant, a so called high-k material, a physically thicker gate dielectric is allowed to achieve the same capacitance [58, 59]....
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5,442 citations
"Low-frequency noise characterizatio..." refers methods in this paper
...The capture and emission times, τc and τe, are in general governed by from ShockleyRead-Hall statistics [184]...
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3,700 citations
"Low-frequency noise characterizatio..." refers background in this paper
...For bulk semiconductors, temperature relation μb ∝ T -3/2 and μC ∝ T 3/2 have been observed [25]....
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3,156 citations
"Low-frequency noise characterizatio..." refers background in this paper
...The thermal noise in the channel depends on the operating condition [120]...
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