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Open AccessJournal ArticleDOI

Low-k Dielectric- A Potential Solution for Crosstalk Induced Signal Integrity issues in SWCNT Interconnects

Nisha Kuruvilla, +2 more
- 01 Jan 2012 - 
- Vol. 1, Iss: 1, pp 23-25
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TLDR
This work analyzes crosstalk in bundled SWCNTs with a better model for extracting inter bundle real life coupling capacitances and proposes a novel idea of reducing crosStalk effects by using low-k dielectric materials as isolation between adjacent nets.
Abstract
Crosstalk creates signal integrity issues due to capacitive coupling between adjacent interconnect wires and it is a matter of concern in high frequency interconnects. The reported work on crosstalk induced signal integrity issues in CNT interconnects till date were assuming the value of coupling capacitance as equivalent to the coupling effect between metal interconnects of same dimensions. This work tries to fill that gap; by analyzing crosstalk in bundled SWCNTs with a better model for extracting inter bundle real life coupling capacitances. This work also proposes a novel idea of reducing crosstalk effects by using low-k dielectric materials as isolation between adjacent nets. It is found that compact bundles separated by low-k dielectric can reduce crosstalk effect considerably. Keywords - Crosstalk, signal integrity, SWCNT, MWCNT, Mixed CNT

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References
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Proceedings ArticleDOI

Performance analysis of carbon nanotube interconnects for VLSI applications

TL;DR: It is shown that CNT bundles can outperform copper for long intermediate and global interconnects, and can be engineered to compete with copper for local level interConnects.
Journal ArticleDOI

Crosstalk Prediction of Single- and Double-Walled Carbon-Nanotube (SWCNT/DWCNT) Bundle Interconnects

TL;DR: In this article, the authors investigated the crosstalk effects in single and double-walled carbon-nanotube (SWCNT and DWCNT) bundle-interconnect architectures.
Journal ArticleDOI

Fast Transient Analysis of Next-Generation Interconnects Based on Carbon Nanotubes

TL;DR: In this article, the time-domain analysis of CMOS gates driving next-generation interconnects consisting of single wall carbon nanotube (SWCNT) bundles or multiwall carbon nanotideubes (MWCNTs) is carried out.
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TL;DR: Issues associated with crosstalk among bus lines implemented by CNTs are investigated in detail and the proposed bus arrangement noticeably improves performance and provides reliable operation.
Journal ArticleDOI

Analysis of Crosstalk in Single- and Multiwall Carbon Nanotube Interconnects and Its Impact on Gate Oxide Reliability

TL;DR: In this paper, the impact of crosstalk effects in carbon nanotube (CNT) interconnects and its impact on the gate oxide reliability was analyzed and the results showed that the CNT-based interconnect is more suitable in VLSI circuits as far as the gate oxidation is concerned.
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