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Metal Induced Crystallization

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TLDR
In this paper, a variety of methods for lowering the crystallization temperature of polycrystalline silicon thin films have been developed, which can render larger grains compared to the conventional poly Si film deposition.
Abstract
Polycrystalline silicon thin films have attracted the attention of semiconductor industries in the past few decades due to their wide applications in thin film transistors, solar cells, display units and sensors (Schropp & Zeman, 1998; Choi et al., 2005; Mahan et al., 2008). Polycrystalline Si thin films are generally fabricated by crystallizing amorphous Si (a-Si) thin films, because these can render larger grains compared to the conventional poly Si film deposition. As a consequence, a variety of methods for lowering the crystallization temperature of a-Si have been developed. Excimer laser annealing is one of the promising ways to achieve large grain size poly Si films at lower substrate temperatures. Its high costs and nonuniform grain size, however, are significant obstacles that prevent its wide use (Parr et al., 2002). The other promising technique is the solid phase crystallization method. But this technique is essentially a high-temperature process and many substrates, including most forms of glass, cannot withstand the thermal processing. In order to achieve lower costs and have a wider range of application, inexpensive materials such as glass and special polymers have to substitute quartz or PyrexTM substrates. In the case of glass substrates, all of the processing steps need to be limited to temperatures below 550 °C. The other known technique is rapid thermal annealing (RTA). In RTA infrared radiation is used as a heating source, and has the advantage of the high heating speed (up to 60 oC/s) that reduces the crystallization time. In RTA radiation is applied in pulses to heat the sample without heating the glass substrate (which is transparent to the infrared radiation). However, the grain size obtained in the crystallization of a-Si is also in the range of a few micrometers.

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Journal ArticleDOI

Tin induced a-Si crystallization in thin films of Si-Sn alloys

TL;DR: In this article, the effects of tin doping on crystallization of amorphous silicon were studied using Raman scattering, Auger spectroscopy, scanning electron microscopy, and X-ray fluorescence techniques.
Journal ArticleDOI

Self-sustained cyclic tin induced crystallization of amorphous silicon

TL;DR: In this article, a nonlinear dynamical model for tin-induced crystallization of amorphous silicon is presented. But the model does not take into account the mass diffusion of the components of the system, heat transfer caused by latent (crystallization) heat release and amorphus silicon dissolution events, and concentration nonuniformities created by silicon crystallization.
Journal ArticleDOI

Nanocrystals Growth Control during Laser Annealing of Sn

TL;DR: In this article, an efficient technique for low temperature metal-induced nanocrystalline silicon fabrication is presented based on laser annealing of thin films of "amorphous silicon-tin" composites combined with in situ control and monitoring with Raman technique.
Journal ArticleDOI

Evolution of phases and their thermal stability in Ge–Sn nanofilms: a comprehensive in situ TEM investigation

TL;DR: In this article, the authors demonstrate the high potential of using nanosized, layered Sn/amorphous-Ge films for the synthesis of Ge-Sn solid solutions with an enhanced Sn content, and observe the formation of highly uniform, diamond structured Ge1-xSnx solid solution with Sn content of 33% by metal-induced crystallization (MIC) at 90°C.
Journal ArticleDOI

Influence of Laser Light on the Formation and Properties of Silicon Nanocrystals in a-Si/Sn Layered Structures

TL;DR: In this article, the influence of the laser light intensity and the temperature on the tin-induced crystallization of amorphous silicon has been studied using the Raman screening and optical microscopy methods.
References
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Journal ArticleDOI

Theory of Growth of Spherical Precipitates from Solid Solution

TL;DR: In this paper, the radius of a spherical precipitate particle growing in a solid solution of initially uniform composition was shown to be equal to α(Dt)½, where D is the atomic diffusion coefficient, t the time of growth, and α, the growth coefficient, is a dimensionless function of the pertinent compositions.
Journal ArticleDOI

Silicide formation and silicide‐mediated crystallization of nickel‐implanted amorphous silicon thin films

TL;DR: In this paper, the nucleation and growth of isolated nickel disilicide precipitates in amorphous Si thin films and the subsequent low-temperature silicide-mediated crystallization of Si was studied using in situ transmission electron microscopy.
Journal ArticleDOI

Phase transformations of silicon caused by contact loading

TL;DR: In this paper, the authors combine hardness indentation tests and micro-Raman spectroscopy to show that metallic Si-II is produced near the interface of a diamond indenter and silicon to a depth of about 0.5 μm.
Journal ArticleDOI

Elucidation of the layer exchange mechanism in the formation of polycrystalline silicon by aluminum-induced crystallization

TL;DR: Aluminum-induced crystallization of amorphous silicon is studied as a promising low-temperature alternative to solid-phase and laser crystallization in this article, where the overall process of the Al and Si layer exchange during annealing at temperatures below the eutectic temperature of 577 °C is investigated by various microscopy techniques.
Journal ArticleDOI

Crystal grain nucleation in amorphous silicon

TL;DR: In this paper, the morphological evolution of the amorphous towards the polycrystalline phase is investigated by transmission electron microscopy and it is interpreted in terms of a physical model containing few free parameters related to the thermodynamical properties of ammorphous silicon and to the kinetical mechanisms of crystal grain growth.
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