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Mobility and Saturation Velocity in Graphene on SiO2

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TLDR
In this paper, the authors examined mobility and saturation velocity in graphene on SiO2 above room temperature (300-500 K) and at high fields (~1 V/um).
Abstract
We examine mobility and saturation velocity in graphene on SiO2 above room temperature (300-500 K) and at high fields (~1 V/um). Data are analyzed with practical models including gated carriers, thermal generation, "puddle" charge, and Joule heating. Both mobility and saturation velocity decrease with rising temperature above 300 K, and with rising carrier density above 2x10^12 cm^-2. Saturation velocity is >3x10^7 cm/s at low carrier density, and remains greater than in Si up to 1.2x10^13 cm^-2. Transport appears primarily limited by the SiO2 substrate, but results suggest intrinsic graphene saturation velocity could be more than twice that observed here.

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Electronics based on two-dimensional materials

TL;DR: A review of electronic devices based on two-dimensional materials, outlining their potential as a technological option beyond scaled complementary metal-oxide-semiconductor switches and the performance limits and advantages, when exploited for both digital and analog applications.
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Thermal properties of graphene: Fundamentals and applications

TL;DR: Graphene is a two-dimensional (2D) material with over 100-fold anisotropy of heat flow between the in-plane and out-of-plane directions.
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Experimental Review of Graphene

TL;DR: In this paper, the most important experimental results at a level of detail appropriate for new graduate students who are interested in a general overview of the fascinating properties of graphene from an experimental perspective.
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Two-dimensional materials and their prospects in transistor electronics

TL;DR: A wish list of properties for a good transistor channel material is composed and to what extent the two-dimensional materials fulfill the criteria of the list is examined and a balanced view of both the pros and cons of these devices is provided.
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Effects of Polycrystalline Cu Substrate on Graphene Growth by Chemical Vapor Deposition

TL;DR: The number of graphene defects and nucleation sites appears Cu facet invariant at growth temperatures above 900 °C, and it is determined that (111) containing facet produce pristine monolayer graphene with higher growth rate than (100) containing facets, especially Cu.
References
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Journal ArticleDOI

Giant intrinsic carrier mobilities in graphene and its bilayer

TL;DR: Measurements show that mobilities higher than 200 000 cm2/V s are achievable, if extrinsic disorder is eliminated and a sharp (thresholdlike) increase in resistivity observed above approximately 200 K is unexpected but can qualitatively be understood within a model of a rippled graphene sheet in which scattering occurs on intraripple flexural phonons.
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Current saturation in zero-bandgap, top-gated graphene field-effect transistors.

TL;DR: The first observation of saturating transistor characteristics in a graphene field-effect transistor is reported, demonstrating the feasibility of two-dimensional graphene devices for analogue and radio-frequency circuit applications without the need for bandgap engineering.
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Observation of electron–hole puddles in graphene using a scanning single-electron transistor

TL;DR: In this article, a scanning single-electron transistor is used to map the local density of states and the carrier density landscape in the vicinity of the neutrality point, and it is shown that electron-hole puddles can be quantitatively accounted for by considering noninteracting electrons and holes.
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A self-consistent theory for graphene transport

TL;DR: It is demonstrated theoretically that most of the observed transport properties of graphene sheets at zero magnetic field can be explained by scattering from charged impurities, and it is found that, contrary to common perception, these properties are not universal but depend on the concentration of charged impurity nimp.
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A review of some charge transport properties of silicon

TL;DR: In this article, the present knowledge of charge transport properties in silicon, with special emphasis on their application in the design of solid-state devices, is reviewed, and most attention is devoted to experimental findings in the temperature range around 300 K and to high-field properties.
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