scispace - formally typeset
Search or ask a question
Journal ArticleDOI

On the Limiting Bandwidth of Interference Filters : Influence of Temperature during Production

01 Dec 1974-Journal of Modern Optics (Taylor & Francis Group)-Vol. 21, Iss: 12, pp 927-946
TL;DR: In this paper, the simulation of thin-film multilayer production has been modified to take account of the influence of temperature on the performance of complete coatings in stack production.
Abstract: Computer simulation of thin-film multilayer production has shown that the effects of errors in the layers on the performance of complete coatings depends strongly on the particular monitoring process used. Deposition of dielectric quarter-wave multilayers is usually controlled by a method which involves the detection of the maxima and minima of transmission for the centre wavelength of the filter, the turning value method, and we know that this technique profits from an exceptionally efficient error compensation. The true tolerances in stack production are much larger than we would calculate neglecting this compensation. However, the analysis of experimental results shows that we must consider other effects which have so far been neglected in the computer simulation and which affect the monitoring process enough to prevent the fabrication of interference filters with very narrow transmission bands. Here we describe how the computer simulation is modified to take account of the influence of temperature cha...
Citations
More filters
Journal ArticleDOI
TL;DR: In this paper, a review of the problems in the production of narrow-band all-dielectric thin-film optical filters is presented, where the authors consider only designs composed entirely of optical thicknesses which are integral multiples of a quarter-wave.

34 citations

Journal ArticleDOI
TL;DR: In this paper, the optical properties of thirty-five all-dielectric spectral filter coatings for the visible spectrum have been investigated and correlated with the deposition conditions of the constituent layers of cryolite and zinc sulfide and with the processes which occur when the coatings are exposed to atmosphere.
Abstract: The optical properties of thirty-five all-dielectric spectral filter coatings for the visible spectrum have been investigated and correlated with the deposition conditions of the constituent layers of cryolite and zinc sulfide and with the processes which occur when the coatings are exposed to atmosphere. It will be shown that the results of measurements of transmittance and reflectance over the passband wavelengths can be predicted theoretically only if account is taken of absorption in the layers and scattering at the rough boundaries and of changes in the refractive indices of the layers due to water penetration.

31 citations

Book ChapterDOI
01 Jan 1999
TL;DR: A thin invisible oxide film is deposited generally by the application of a hot-end coating after the containers leave the forming machine, and before they enter the annealing lehr as mentioned in this paper.
Abstract: Thin films are applied to effect a desired change in chemical and/or physical properties of glass and plastic surfaces. Glass containers such as nonreturnable and returnable bottles, conventional, and light-weight are coated by CVD and spray processes with various metallic oxides such as tin oxide, and are given topcoats such as nontoxic silicones, various waxes, and glycols. The thin invisible oxide film is deposited generally by the application of a hot-end coating after the containers leave the forming machine, and before they enter the annealing lehr. The organic coating, known as a cold-end coating, is applied over the oxide film at a lower temperature when the glass containers emerge from the lehr. Protection from friction damage is essential in modern filling lines where speeds of up to 800 bottles min –1 are used. Thin vitreous coatings of SiO 2 , TiO 2, and ZrO 2 deposited by precipitation from solutions, and suitable for a variety of technical glass applications, can also be used to protect ancient glasses against weathering. Moisture-sensitive optical components, such as alkali metal halide materials, require protection against exposure to high humidity. In addition, they need antireflective surface properties. With plasma polymerization, pinhole-free, highly adherent, mechanically intact fluorocarbon-type polymer films in the thickness range between 500 and 1500 nm can be obtained.

18 citations

Journal ArticleDOI
TL;DR: In this article, the more recent developments in the monitoring of multilayer optical coatings are surveyed with particular emphasis on techniques which have been investigated at Marseille, and some of the essential limitations of optical monitoring are discussed and areas where further research is needed are identified.

15 citations

Journal ArticleDOI
TL;DR: In this paper, a significant advance in the study of this problem has been obtained by simulating the monitoring process on a computer, which is necessary, for each material used, to determine the dilatation coefficients of both refractive index and thickness.
Abstract: For narrow-band interference filters, we generally observe a small variation of peak wavelength with time; this variation of filter characteristics depends to a large degree on the materials of which these filters are made, and on the manufacturing process. Several explanations have been given to take account of this effect, which is particularly dramatic in the case of very narrow-band filters, so it is of the utmost importance to study in detail the influence of parameters such as the shift of temperature within the plant during deposition. The aim of this work is to know how to produce filters whose optical characteristics are steady with time. A significant advance in the study of this problem has been obtained by simulating the monitoring process on a computer. However, it is necessary, for each material used, to determine the dilatation coefficients of both refractive index and thickness. In this work we show how these coefficients may be deduced from measurements of shifts with temperature of the p...

11 citations

References
More filters
Journal ArticleDOI
TL;DR: In this article, the effects of errors in the turning value method of film-thickness monitoring on the performance of all-dielectric interference filters were studied theoretically by both an accurate and an approximate method, and it was shown that although the potential accuracy of the method in monitoring a single layer is very poor, the theoretical accuracy of peak frequency and the overall performance of complete narrow-band filters are extremely good.
Abstract: The effects, on the performance of all-dielectric interference filters, of errors in the turning value method of film-thickness monitoring, are studied theoretically by both an accurate and an approximate method. It is shown that, although the potential accuracy of the method in monitoring a single layer is very poor, the theoretical accuracy of peak frequency and the overall performance of complete narrow-band filters are extremely good. Poor performance of real production filters is therefore unlikely to be due to an inherent limitation of the method, but rather to a faulty application of it, or to other factors unconnected with the monitoring method.

131 citations

Journal ArticleDOI
P. Bousquet1, A. Fornier1, R. Kowalczyk1, E. Pelletier1, P. Roche1 
TL;DR: In this article, it is known that the optical properties of dielectric quarter-wave multilayers are stationary in relation to the thickness of each layer, and this property is particularly interesting for the purpose of controlling the production of such stacks.

91 citations

Journal ArticleDOI
TL;DR: In this article, a simulation par le calcul sur ordinateur permet de montrer que l'influence des erreurs de realisation de chaque couche, sur le resultat final, depend du procede de controle utilise.
Abstract: Pour controler la formation de couches d'epaisseurs optiques ne egales ou multiples d'une meme valeur u0/4, on utilise couramment des methodes optiques. Il est en particulier commode de reperer, au cours de l'evaporation, pour la longueur d'onde de centrage du filtre u0, les extremums du facteur de transmission T. Mais on doit bien distinguer les extremums correspondant a ‘T/‘ e=0 des extremums du profil spectral (‘T/‘u=0) observables pendant le depot de chaque couche. La simulation par le calcul sur ordinateur permet de montrer que l'influence des erreurs de realisation de chaque couche, sur le resultat final, depend du procede de controle utilise. Le reperage des zeros de ‘T/‘u ne permet pas de beneficier d'une compensation des erreurs aussi exceptionnelle que celui des zeros de ‘T/‘e. On souligne ainsi l'interet du choix d'un controle ‘stable’ ou l'influence des erreurs cumulatives est telle que leurs effets se compensent parfaitement. Les tolerances de realisation des filtres interferentiels sont alor...

20 citations

Journal ArticleDOI
01 Mar 1959
TL;DR: In this article, the effects of variations of the thickness of the individual layers of an interference filter made with dielectric multilayers are examined, with respect both to the displacement of the pass band and to its width as affected by random fluctuations in these thicknesses.
Abstract: The effects of variations of the thickness of the individual layers of an interference filter made with dielectric multilayers are examined, with respect both to the displacement of the pass band and to its width as affected by random fluctuations in these thicknesses It is shown that the use of special multilayer stacks having a large dispersion of the phase change on reflection can yield a much greater resolution only in the case of perfectly uniform films The insensitivity of the pass band to variations of the spacer layer is compensated by a correspondingly large sensitivity to variations of the layers constituting the `mirrors' It is also shown that the effect of random thickness variations is a minimum when the sensitivities of all layers are proportional to their thicknesses Sample calculations and experimental illustrations are given

14 citations

Journal ArticleDOI
TL;DR: In this article, the effects of absorption on the theoretical accuracy of the turning value method of film thickness monitoring in the production of thin-film all-dielectric narrow band optical filters are investigated.
Abstract: The effects of absorption on the theoretical accuracy of the turning value method of film thickness monitoring in the production of thin-film all-dielectric narrow band optical filters are investigated. It is shown that the performance of the method is at least as good as it is in the absence of absorption, although care must be taken in the interpretation of the monitoring signals for certain critical layers.

13 citations