Optical Measurement of Surface Topography

doi:10.1007/978-3-642-12012-1

Book•DOI•

Optical Measurement of Surface Topography

01 Jan 2011-

TL;DR: In this paper, surface texture measurement using optical 3D sensors has been studied and some common terms and definitions have been defined, including the limitations of optical sensors and limitations of 3D surface topography measuring instruments.

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Abstract: Introduction to surface texture measurement.- Some common terms and definitions.- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy.- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.- Coherence scanning interferometry.- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods

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Journal Article•DOI•

Review of in-situ process monitoring and in-situ metrology for metal additive manufacturing

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Sarah K. Everton¹, Sarah K. Everton², Matthias Hirsch², Petros Stravroulakis², Richard Leach², Adam T. Clare² - Show less +2 more•Institutions (2)

Coventry Health Care¹, University of Nottingham²

05 Apr 2016-Materials & Design

TL;DR: In this paper, the state-of-the-art with respect to inspection methodologies compatible with additively manufactured (AM) processes is explored with the intention of identifying new avenues for research and proposing approaches to integration into future generations of AM systems.

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1,024 citations

Cites background from "Optical Measurement of Surface Topo..."

...However, there are two distinct classes of instrument: (a) those thatmeasure over large areas (metres squared)with tens to hundreds ofmicrometres spatial resolution (for example, fringe projection, photogrammetry and Moiré interferometry) [121], and (b) those that measure over small areas (up to a few millimetres squared) with spatial resolutions of the order of amicrometre (for example, coherence scanning interferometry (CSI), confocal microscopy and focus variation microscopy (FVM)) [122]....
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Journal Article•DOI•

Surface texture metrology for metal additive manufacturing: a review

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Andrew Townsend¹, Nicola Senin², Nicola Senin³, Liam Blunt¹, Richard Leach², J.S. Taylor⁴ - Show less +2 more•Institutions (4)

University of Huddersfield¹, University of Nottingham², University of Perugia³, University of North Carolina at Charlotte⁴

01 Oct 2016-Precision Engineering-journal of The International Societies for Precision Engineering and Nanotechnology

TL;DR: A comprehensive analysis of surface texture metrology for metal additive manufacturing has been performed in this paper, where the results of this analysis are divided into sections that address specific areas of interest: industrial domain; additive manufacturing processes and materials; types of surface investigated; surface measurement technology and surface texture characterisation.

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Abstract: A comprehensive analysis of literature pertaining to surface texture metrology for metal additive manufacturing has been performed. This review paper structures the results of this analysis into sections that address specific areas of interest: industrial domain; additive manufacturing processes and materials; types of surface investigated; surface measurement technology and surface texture characterisation. Each section reports on how frequently specific techniques, processes or materials have been utilised and discusses how and why they are employed. Based on these results, possible optimisation of methods and reporting is suggested and the areas that may have significant potential for future research are highlighted.

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537 citations

Book•

Characterisation of Areal Surface Texture

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Richard Leach

03 Apr 2013

TL;DR: In this article, the areal field parameters and areal feature parameters were compared to solar cell efficiency and the mechanical bond strength for copper on glass plating applications, using laser-structured cams and conrods.

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Abstract: Introduction to surface topography.- The areal field parameters.- The areal feature parameters.- Areal filtering methods.- Areal form removal.- Areal fractal methods.- Choosing the appropriate parameter.- Characterization of individual areal features.- Multi-scale signature of surface topography.- Correlation of areal surface texture parameters to solar cell efficiency.- Characterisation of cylinder liner honing textures for production control.- Characterization of the mechanical bond strength for copper on glass plating applications.- Inspection of laser structured cams and conrods.- Road surfaces.

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340 citations

Cites background or methods from "Optical Measurement of Surface Topo..."

...J Vac Sci Technol B 26:1794–1799 Leach RK (2009) Fundamental principles of engineering nanometrology. Elsevier, Amsterdam Leach RK (2011) Optical measurement of surface topography. Springer, Berlin Leach RK (2001) The measurement of surface texture using stylus instruments. NPL good practice guide No 37. National Physical Laboratory Leach RK, Boyd R, Burke T, Danzebrink H-U, Dirscherl K, Dziomba T, Gee M, Koenders L, Morazzani V, Pidduck A, Roy D, Unger WES, Yacoot A (2011) The European nanometrology landscape. Nanotechnology 22:062001 Mainsah E, Greenwood JA, Chetwynd DG (2010) Metrology and properties of engineering surfaces....
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...J Vac Sci Technol B 26:1794–1799 Leach RK (2009) Fundamental principles of engineering nanometrology. Elsevier, Amsterdam Leach RK (2011) Optical measurement of surface topography. Springer, Berlin Leach RK (2001) The measurement of surface texture using stylus instruments....
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...J Vac Sci Technol B 26:1794–1799 Leach RK (2009) Fundamental principles of engineering nanometrology. Elsevier, Amsterdam Leach RK (2011) Optical measurement of surface topography. Springer, Berlin Leach RK (2001) The measurement of surface texture using stylus instruments. NPL good practice guide No 37. National Physical Laboratory Leach RK, Boyd R, Burke T, Danzebrink H-U, Dirscherl K, Dziomba T, Gee M, Koenders L, Morazzani V, Pidduck A, Roy D, Unger WES, Yacoot A (2011) The European nanometrology landscape....
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...J Vac Sci Technol B 26:1794–1799 Leach RK (2009) Fundamental principles of engineering nanometrology....
[...]
...J Vac Sci Technol B 26:1794–1799 Leach RK (2009) Fundamental principles of engineering nanometrology. Elsevier, Amsterdam Leach RK (2011) Optical measurement of surface topography....
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Journal Article•DOI•

Marine biofilms on artificial surfaces: structure and dynamics

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Maria Salta¹, Julian A. Wharton¹, Yves Blache, Keith Stokes², Keith Stokes¹, Jean-François Briand - Show less +2 more•Institutions (2)

University of Southampton¹, Salisbury University²

01 Nov 2013-Environmental Microbiology

TL;DR: Overall, differences have been identified in species composition between biofilm and planktonic forms for both diatoms and bacteria at various exposure sites, and issues such as reproducibility, differences in exposure sites and biofilm composition may influence the outcomes.

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Abstract: The search for new antifouling (AF) coatings that are environmentally benign has led to renewed interest in the ways that micro-organisms colonize substrates in the marine environment. This review covers recently published research on the global species composition and dynamics of marine biofilms, consisting mainly of bacteria and diatoms found on man-made surfaces including AF coatings. Marine biofilms directly interact with larger organisms (macrofoulers) during colonization processes; hence, recent literature on understanding the basis of the biofilm/macrofouling interactions is essential and will also be reviewed here. Overall, differences have been identified in species composition between biofilm and planktonic forms for both diatoms and bacteria at various exposure sites. In most studies, the underlying biofilm was found to induce larval and spore settlement of macrofoulers; however, issues such as reproducibility, differences in exposure sites and biofilm composition (natural multispecies vs. monospecific species) may influence the outcomes.

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318 citations

Journal Article•DOI•

Optical tuning of exciton and trion emissions in monolayer phosphorene

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Jiong Yang¹, Renjing Xu¹, Jiajie Pei¹, Jiajie Pei², Ye Win Myint¹, Fan Wang¹, Zhu Wang³, Shuang Zhang¹, Zongfu Yu³, Yuerui Lu¹ - Show less +6 more•Institutions (3)

Australian National University¹, Beijing Institute of Technology², University of Wisconsin-Madison³

17 Jul 2015-Light-Science & Applications

TL;DR: Yang et al. as discussed by the authors used phase-shifting interferometry to determine the number of phosphorene layers, and confirmed the results with reliable photoluminescence measurements.

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Abstract: Monolayer phosphorene provides a unique two-dimensional (2D) platform to investigate the fundamental dynamics of excitons and trions (charged excitons) in reduced dimensions. However, owing to its high instability, unambiguous identification of monolayer phosphorene has been elusive. Consequently, many important fundamental properties, such as exciton dynamics, remain underexplored. We report a rapid, noninvasive, and highly accurate approach based on optical interferometry to determine the layer number of phosphorene, and confirm the results with reliable photoluminescence measurements. Furthermore, we successfully probed the dynamics of excitons and trions in monolayer phosphorene by controlling the photo-carrier injection in a relatively low excitation power range. Based on our measured optical gap and the previously measured electronic energy gap, we determined the exciton binding energy to be ∼0.3 eV for the monolayer phosphorene on SiO2/Si substrate, which agrees well with theoretical predictions. A huge trion binding energy of ∼100 meV was first observed in monolayer phosphorene, which is around five times higher than that in transition metal dichalcogenide (TMD) monolayer semiconductor, such as MoS2. The carrier lifetime of exciton emission in monolayer phosphorene was measured to be ∼220 ps, which is comparable to those in other 2D TMD semiconductors. Our results open new avenues for exploring fundamental phenomena and novel optoelectronic applications using monolayer phosphorene. An optical scheme for determining the number of monolayers on two-dimensional materials has been developed. Research into two-dimensional materials is thriving, but developing a way to identify a single monolayer has proved challenging. Now, Jiong Yang and co-workers have used phase-shifting interferometry to deduce the number of phosphorene layers. They then performed power-dependent photoluminescence measurements to determine various excitonic properties of a monolayer on a silicon oxide/silicon substrate. They obtained an exciton binding energy of about 0.3 electron volts, which agrees well with theoretical predictions. The researchers measured a carrier lifetime of approximately 220 picoseconds, which is comparable to that of the transition-metal dichalcogenides, another class of two-dimensional semiconductors. They also measured a trion binding energy of about 100 milli-electron volts, which is around five times higher than that of transition-metal dichalcogenides.

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313 citations

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Optical Measurement of Surface Topography

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