Journal ArticleDOI
Optimal Selective Huffman Coding for Test-Data Compression
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TLDR
In this paper, the authors show that the already proposed encoding scheme is not optimal and present a new one, proving that it is optimal Moreover, they compare the two encodings theoretically and derive a set of conditions which show that, in practical cases, the proposed encoding always offers better compression in terms of hardware overhead.Abstract:
Selective Huffman coding has recently been proposed for efficient test- data compression with low hardware overhead In this paper, we show that the already proposed encoding scheme is not optimal and we present a new one, proving that it is optimal Moreover, we compare the two encodings theoretically and we derive a set of conditions which show that, in practical cases, the proposed encoding always offers better compression In terms of hardware overhead, the new scheme is at least as low-demanding as the old one The increased compression efficiency, the resulting test-time savings, and the low hardware overhead of the proposed method are also verified experimentallyread more
Citations
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Compression of smart meter big data: A survey
TL;DR: This study presents a comprehensive study on the compression techniques for smart meter big data to reduce the transmission pressure and storage overhead, improve data mining efficiency, and thus fulfil the potential of smart meterbig data.
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Test Data Compression Using Efficient Bitmask and Dictionary Selection Methods
Kanad Basu,Prabhat Mishra +1 more
TL;DR: A novel test data compression technique using bitmasks which provides a substantial improvement in the compression efficiency without introducing any additional decompression penalty is proposed.
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Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability
TL;DR: A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper and Huffman, which is a well-known fixed-to- variable code, is used as a variable- to-variable code.
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$2^{n}$ Pattern Run-Length for Test Data Compression
TL;DR: A new pattern run-length compression method whose decompressor is simple and easy to implement that can achieve an average compression ratio of 67.64% and considerable test application time savings.
Journal ArticleDOI
Input Test Data Compression Based on the Reuse of Parts of Dictionary Entries: Static and Dynamic Approaches
TL;DR: A new test data compression method for intellectual property (IP) cores testing, based on the reuse of parts of dictionary entries, is presented, supported with extensive simulation results and comparisons to already known testData compression methods suitable for IP cores testing.
References
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Journal ArticleDOI
A Method for the Construction of Minimum-Redundancy Codes
TL;DR: A minimum-redundancy code is one constructed in such a way that the average number of coding digits per message is minimized.
Journal ArticleDOI
A method for the construction of minimum-redundancy codes
TL;DR: A minimum-redundancy code is one constructed in such a way that the average number of coding digits per message is minimized.
Journal ArticleDOI
Embedded deterministic test
TL;DR: This paper presents a novel test-data volume-compression methodology called the embedded deterministic test (EDT), which reduces manufacturing test cost by providing one to two orders of magnitude reduction in scan test data volume and scan test time.
Proceedings ArticleDOI
Test set compaction algorithms for combinational circuits
Ilker Hamzaoglu,Janak H. Patel +1 more
TL;DR: In this paper, two new algorithms, redundant vector elimination (RVE) and essential fault reduction (EFR), were proposed for generating compact test sets for combinational circuits under the single stuck at fault model.
Journal ArticleDOI
System-on-a-chip test-data compression and decompression architectures based on Golomb codes
TL;DR: A new test-data compression method and decompression architecture based on variable-to-variable-length Golomb codes that is especially suitable for encoding precomputed test sets for embedded cores in a system-on-a-chip (SoC).