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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
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TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Citations
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Journal ArticleDOI

Combustion-assisted low-temperature solution process for high-performance SnO2 thin film transistors

TL;DR: In this paper , high-performance SnO2 thin-film transistors were fabricated at temperatures below 300 °C using the combustion-assisted sol-gel method, where the internal energy induced by the exothermic reaction of the fuel and the oxidizer in the combustion precursors facilitates precursor conversion even at low processing temperatures.
Journal ArticleDOI

Combination of InZnO/InGaZnO Bi-layered channels prepared by atomic layer deposition and ozone-based gate-stack formation for guaranteeing high field-effect mobility and long-term stability of thin film transistors

TL;DR: In this paper , a bi-layered channel structure comprising In-Zn-O (IZO) prompt and In-Ga−Zn O (IGZO) prime layers was introduced to enhance the carrier mobility of oxide thin film transistors by atomic layer deposition (ALD) technique.
Journal ArticleDOI

Enhanced structural and electrical features of amorphous InGaZnO thin film transistors via a heavy Kr gas process

TL;DR: In this paper, the influence of a heavy Kr gas sputtering process on the electrical and structural features of amorphous indium-gallium-zincoxide (a-IGZO) thin film transistors (TFTs) was reported.
Journal ArticleDOI

Comparison of In-Plane Stress Development in Sol-Gel- and Nanoparticle-Derived Mesoporous Metal Oxide Thin Films.

TL;DR: The investigation revealed the lowest intrinsic stress for the nanoparticle-derived mesoporous film, which is assigned to the combination of the relaxing effects of the utilized diblock copolymer and the interparticular gaps between the pre-crystalline nanoparticles.
Journal ArticleDOI

Abnormal threshold voltage shift caused by trapped holes under hot-carrier stress in a-IGZO TFTs

TL;DR: In this article, the authors investigated the reliability of a back-channeletching type amorphous InGaZnO thin film transistor and found that hot carrier stress has caused an abnormal parallel negative threshold voltage shift in the I D-V G measurement.
References
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TL;DR: A novel semiconducting material is proposed—namely, a transparent amorphous oxide semiconductor from the In-Ga-Zn-O system (a-IGZO)—for the active channel in transparent thin-film transistors (TTFTs), which are fabricated on polyethylene terephthalate sheets and exhibit saturation mobilities and device characteristics are stable during repetitive bending of the TTFT sheet.
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