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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
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TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Citations
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Journal ArticleDOI

Inkjet‐Printed Narrow‐Channel Mesoporous Oxide‐Based n‐Type TFTs and All‐Oxide CMOS Electronics

TL;DR: In this paper , the authors demonstrate all-oxide CMOS invertors with high-performance narrow-channel n-type TFTs, which can compensate for the limited carrier mobility of the p-type transistors.
Journal ArticleDOI

Experimental and theoretical study of hole scattering in RF sputtered p-type Cu2O thin films

TL;DR: In this article , the authors used experiments, analytical models, and density functional theory calculations to study the scattering mechanisms that determine Hall mobility in two Cu2O samples, and showed that the room-temperature intrinsic hole mobility of cuprous oxide (Cu2O) is 106 cm2/cm2/V−1/s−1, indicating the great promise of the material for p-type electronic devices.
Journal ArticleDOI

High performance IGZO-based phototransistors by BN/BP interface engineering.

TL;DR: A huge improvement in photoresponse performances for the IGZO phototransistor devices is reported by introducing boron nitride (BN)/black phosphorus (BP) interface engineering and the results imply that such interface engineering via 2D materials can be used as a general route to high performance oxide-semiconductor based optoelectronic devices.
Book ChapterDOI

Oxide-Channel Ferroelectric-Gate Thin Film Transistors with Nonvolatile Memory Function

TL;DR: In this article, the principle and progress of oxide-channel ferroelectric-gate transistors were reviewed, and it was shown that even conductive oxide, such as indium-tin-oxide (ITO), can be used as a channel if its thickness is thin enough.
Journal ArticleDOI

Generalized Gated Four-Probe Method for Intrinsic Mobility Extraction With Van Der Pauw Structure

TL;DR: In this article, the generalized gated four-probe and van der Pauw structure were combined to measure the carrier mobility of semiconductors, and the method is geometry-independent, suitable for gatedependent mobility in all operation regimes.
References
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TL;DR: A novel semiconducting material is proposed—namely, a transparent amorphous oxide semiconductor from the In-Ga-Zn-O system (a-IGZO)—for the active channel in transparent thin-film transistors (TTFTs), which are fabricated on polyethylene terephthalate sheets and exhibit saturation mobilities and device characteristics are stable during repetitive bending of the TTFT sheet.
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TL;DR: In this article, the authors present a characterization of the resistivity of a two-point-versus-four-point probe in terms of the number of contacts and the amount of contacts in the probe.
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High-κ gate dielectrics: Current status and materials properties considerations

TL;DR: In this paper, a review of the literature in the area of alternate gate dielectrics is given, based on reported results and fundamental considerations, the pseudobinary materials systems offer large flexibility and show the most promise toward success.
Journal ArticleDOI

Organic Thin Film Transistors for Large Area Electronics

TL;DR: In this article, the authors present new insight into conduction mechanisms and performance characteristics, as well as opportunities for modeling properties of organic thin-film transistors (OTFTs) and discuss progress in the growing field of n-type OTFTs.
Journal ArticleDOI

Polymer‐Fullerene Bulk‐Heterojunction Solar Cells

TL;DR: An outlook is presented on what will be required to drive this young photovoltaic technology towards the next major milestone, a 10% power conversion efficiency, considered by many to represent the efficiency at which OPV can be adopted in wide-spread applications.
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