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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
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TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Citations
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Analysis of Key Factors for High Yield AMOLED Display

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Electrical defect passivation of nanocrystalline In-Ga-O thin film transistor with organic-inorganic superlattice structure

TL;DR: In this paper , the authors report on utilizing the passivation effect from various phosphonic acids (PAs) to suppress the adsorption of ambient chemical species and the oxygen vacancy defect in the superlattice (SL) structure prepared by insertion of PA between two nanocrystalline In-Ga-O (nc-IGO) layers.
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Influence of the Curing and Annealing Temperatures on the Properties of Solution Processed Tin Oxide Thin Films

Christophe Avis, +1 more
TL;DR: In this paper, the effect of the curing and annealing temperatures on the structural, electrical, and optical properties of solution processed tin oxide was investigated, and it was shown that the crystallinity can be effectively controlled by the anneal temperature, but the curing temperature dramatically affects the grain size.
Journal ArticleDOI

Addressing the Conflict between Mobility and Stability in Oxide Thin‐film Transistors

TL;DR: In this article , the carrier transport/relaxation bilayer stacked AOS TFTs are investigated to solve the mobility-stability conflict, and the charge transport layer (CTL) is made of amorphous In-rich InSnZnO, which favors big average effective coordination number for all cations and more edge-shared structures for better charge transport.
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Structural characteristics of Al2O3 ultra-thin films supported on the NiAl(100) substrate from DFTB-aided global optimization.

TL;DR: In this paper, a combined tight-binding/DFT genetic algorithm approach was used to explicitly demonstrate that ultra-thin θ(100)-type films correspond to the structural ground state of alumina supported on the (2 × 1)-NiAl(100) substrate.
References
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TL;DR: In this paper, a review of the literature in the area of alternate gate dielectrics is given, based on reported results and fundamental considerations, the pseudobinary materials systems offer large flexibility and show the most promise toward success.
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TL;DR: In this article, the authors present new insight into conduction mechanisms and performance characteristics, as well as opportunities for modeling properties of organic thin-film transistors (OTFTs) and discuss progress in the growing field of n-type OTFTs.
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Polymer‐Fullerene Bulk‐Heterojunction Solar Cells

TL;DR: An outlook is presented on what will be required to drive this young photovoltaic technology towards the next major milestone, a 10% power conversion efficiency, considered by many to represent the efficiency at which OPV can be adopted in wide-spread applications.
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