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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
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TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: In this article, the recent progress in n-and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p type, and the major milestones already achieved with this emerging and very promising technology are summarized.
References
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Journal ArticleDOI

Origin of Subthreshold Swing Improvement in Amorphous Indium Gallium Zinc Oxide Transistors

TL;DR: In this article, the effect of the channel deposition pressure on the device performance of amorphous indium-gallium-zinc oxide (a-IGZO) transistors was investigated in detail.
Journal ArticleDOI

Effect of indium composition ratio on solution-processed nanocrystalline InGaZnO thin film transistors

TL;DR: In this paper, the effects of the indium content on characteristics of nanocrystalline InGaZnO (IGZO) films grown by a solgel method and their thin film transistors (TFTs) have been investigated.
Journal ArticleDOI

The preparation of copper(II) oxide thin films and the study of their microstructures and optical properties

TL;DR: In this paper, copper(II) oxide thin films were prepared by a sol-gel-like method on microscope glass substrates, and they were observed to crystallize to tenorite structure after heat treatment at 600°C for 30min.
Journal ArticleDOI

Bias dependence of instability mechanisms in amorphous silicon thin‐film transistors

TL;DR: In this article, bias dependence of the threshold voltage shift in a series of amorphous silicon-silicon nitride thin-film transistors was measured, where the composition of the nitride is varied.
Journal ArticleDOI

Sputtering formation of p-type SnO thin-film transistors on glass toward oxide complimentary circuits

TL;DR: In this paper, a simple method to fabricate complimentary circuits by simultaneous selective formation of p-and n-channel TFTs was proposed, which is explained by transformation to a local SnO 2-like structure and finally to SnO2.
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