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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
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TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: In this article, the recent progress in n-and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p type, and the major milestones already achieved with this emerging and very promising technology are summarized.
References
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Journal ArticleDOI

Evaluation of Y2O3 gate insulators for a-IGZO thin film transistors

TL;DR: In this article, a gate insulator for thin-film transistors using an amorphous InGaZnO 4 (a-IGZO) active layer was evaluated as a function of various processing parameters.
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Room-temperature-operated sensitive hybrid gas sensor based on amorphous indium gallium zinc oxide thin-film transistors

TL;DR: An organic sensing layer is capped onto an amorphous indium gallium zinc oxide (a-IGZO) thin-film transistor (TFT) to form a hybrid sensor.
Journal ArticleDOI

Amorphous oxide TFT and their applications in electrophoretic displays

TL;DR: In this paper, an oxide TFT array is fabricated directly onto a color filter array, which facilitates good alignment of the color filter and the TFT arrays, and the electrophoretic display is driven from the viewing side of the display, which is called the "Front Drive" structure.
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Impact of Metal Salt Precursor on Low-Temperature Annealed Solution-Derived Ga-doped In2O3 Semiconductor for Thin-Film Transistors

TL;DR: In this article, the influence of metal salt precursor on the chemical structure evolution of Ga-doped In2O3 (IGO) semiconductor and electrical performance of thin-film transistors with a corresponding oxide semiconductor is investigated.
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Ink-jet printed ZnO nanowire field effect transistors

TL;DR: In this paper, a top-gated zinc oxide nanowire field effect transistors (NW-FETs) fabricated by ink-jet printing was demonstrated, with high resolution submicrometer gold gaps between source and drain electrodes.
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