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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

Elvira Fortunato, +2 more
- 12 Jun 2012 - 
- Vol. 24, Iss: 22, pp 2945-2986
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TLDR
The recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed andp-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed.
Abstract
Transparent electronics is today one of the most advanced topics for a wide range of device applications. The key components are wide bandgap semiconductors, where oxides of different origins play an important role, not only as passive component but also as active component, similar to what is observed in conventional semiconductors like silicon. Transparent electronics has gained special attention during the last few years and is today established as one of the most promising technologies for leading the next generation of flat panel display due to its excellent electronic performance. In this paper the recent progress in n- and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p-type, and the major milestones already achieved with this emerging and very promising technology are summarizeed. After a short introduction where the main advantages of these semiconductors are presented, as well as the industry expectations, the beautiful history of TFTs is revisited, including the main landmarks in the last 80 years, finishing by referring to some papers that have played an important role in shaping transparent electronics. Then, an overview is presented of state of the art n-type TFTs processed by physical vapour deposition methods, and finally one of the most exciting, promising, and low cost but powerful technologies is discussed: solution-processed oxide TFTs. Moreover, a more detailed focus analysis will be given concerning p-type oxide TFTs, mainly centred on two of the most promising semiconductor candidates: copper oxide and tin oxide. The most recent data related to the production of complementary metal oxide semiconductor (CMOS) devices based on n- and p-type oxide TFT is also be presented. The last topic of this review is devoted to some emerging applications, finalizing with the main conclusions. Related work that originated at CENIMAT|I3N during the last six years is included in more detail, which has led to the fabrication of high performance n- and p-type oxide transistors as well as the fabrication of CMOS devices with and on paper.

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Journal ArticleDOI

Oxide Semiconductor Thin‐Film Transistors: A Review of Recent Advances

TL;DR: In this article, the recent progress in n-and p-type oxide based thin-film transistors (TFT) is reviewed, with special emphasis on solution-processed and p type, and the major milestones already achieved with this emerging and very promising technology are summarized.
References
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Journal ArticleDOI

Fast and Stable Solution-Processed Transparent Oxide Thin-Film Transistor Circuits

TL;DR: In this article, a solution-processed ZTO TFT has shown saturation mobility >;2.5 ± 0.29 cm2/V · s (W/L = 100/10 μm) and subthreshold slope ; 50 V for several hours.
Journal ArticleDOI

Atmospheric plasma discharge chemical vapor deposition of SnOx thin films using various tin precursors

TL;DR: A series of 0.2-0.6-μm thick SnO x films were deposited onto borosilicate and sodalime silica glass substrates by atmospheric plasma discharge chemical vapor deposition at 80°C as mentioned in this paper.
Journal ArticleDOI

Influence of Channel Stoichiometry on Zinc Indium Oxide Thin-Film Transistor Performance

TL;DR: In this paper, thin-film transistors using a semiconductor of the form (ZnO)x( In2O3)1-x were fabricated via combinatorial RF sputtering, and two sets of devices were annealed under oxygen at 300degC and 600degC, with another left as deposited.
Journal ArticleDOI

Effects of channel dimensions on performance of a-InGaZnO4 thin-film transistors

TL;DR: In this article, the effects of channel dimensions on the properties of amorphous-InGaZnO4 (a-IGZO) thin-film transistors were investigated.
Journal ArticleDOI

Oxide Semiconductor-Based Organic/Inorganic Hybrid Dual-Gate Nonvolatile Memory Thin-Film Transistor

TL;DR: An organic/inorganic hybrid dual-gate (DG) nonvolatile memory thin-film transistor (M-TFT) was proposed as a device with high potential for implementing large-area electronics on flexible and/or transparent substrates as mentioned in this paper.
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