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Proceedings ArticleDOI

Reduced code linearity testing of pipeline adcs in the presence of noise

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TLDR
Experimental measurements demonstrate that this reduced code testing technique estimates the static performances with an accuracy equivalent to the standard histogram technique, and only 6 % of the codes need to be considered which represents a very significant test time reduction.
Abstract
Reduced code testing of a pipeline analog-to-digital converter (ADC) consists of inferring the complete static transfer function by measuring the width of a small subset of codes. This technique exploits the redundancy that is present in the way the ADC processes the analog input signal. The main challenge is to select the initial subset of codes such that the widths of the rest of the codes can be estimated correctly. By applying the state-of-the-art technique to a real 11-bit 2.5-bit/stage, 55nm pipeline ADC, we observed that the presence of noise affected the accuracy of the estimation of the static performances (e.g, differential nonlinearity and integral non-linearity). In this paper, we exploit another feature of the redundancy to cancel out the effect of noise. Experimental measurements demonstrate that this reduced code testing technique estimates the static performances with an accuracy equivalent to the standard histogram technique. Only 6 % of the codes need to be considered which represents a very significant test time reduction.

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Citations
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Journal ArticleDOI

Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique

TL;DR: It is shown that by exploiting some inherent properties in the architecture of pipeline ADCs the authors can achieve significant static test time reduction while maintaining the accuracy of the standard histogram test.
Journal ArticleDOI

A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs

TL;DR: This work presents an efficient on-chip ramp generator targeting to facilitate the deployment of Built-In Self-Test techniques for ADC static linearity characterization based on a fully-differential switched-capacitor integrator that is conveniently modified to produce a very small integration gain.
Proceedings ArticleDOI

Design of an on-chip stepwise ramp generator for ADC static BIST applications

TL;DR: This work presents guidelines for the design of an on-chip ramp signal generator for static Built-In Self-Test (BIST) of ADCs based on a fully-differential switched-capacitor integrator conveniently modified to produce a very small integration gain.
Proceedings ArticleDOI

INL systematic reduced-test technique for Pipeline ADCs

TL;DR: This paper presents a procedure to implement a high efficient test of the Integral Non-linearity (INL) of Pipeline ADCs using an extremely reduced set of test input amplitude levels (one order of magnitude lower than the total number of codes in the ADC).
Proceedings ArticleDOI

On-Chip Implementation of an Integrator-Based Servo-Loop for ADC Static Linearity Test

TL;DR: This paper explores different possibilities for the on-chip implementation of an external analog signal generator in the ATE to extend the static linearity test to a BIST implementation.
References
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Proceedings ArticleDOI

Production test challenges for highly integrated mobile phone SOCs — A case study

TL;DR: An overview over the test concept of a complex mobile phone SOC, which consists of a variety of embedded M/S blocks, an embedded FM radio, and a complete RF transceiver for mobile communication, is given.
Journal ArticleDOI

A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs

TL;DR: This paper investigates the viability of an ADC BIST scheme for implementing the histogram test technique and shows that the choice of a triangle-wave input signal combined with an appropriate time decomposition technique of the test procedure permits to drastically reduce the required on-chip hardware circuitry.
Journal ArticleDOI

Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction

TL;DR: A transition-code based method that can achieve high test accuracy for a 12-bit 1.5-bit/stage pipelined ADC with different nonlinearities by measuring only 9.3% of the total measured samples of the conventional histogram based method is proposed.
Journal ArticleDOI

High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy

TL;DR: Simulation and experimental results show that the proposed circuitry and BIST strategy can test the INLk error of 12-bit ADCs to a plusmn0.15 least significant bit (LSB) accuracy level using only 7-bit linear DACs.
Proceedings ArticleDOI

Optimal Schemes for ADC BIST Based on Histogram

TL;DR: Two testing time reducing schemes of histogram-based BIST (built-in self test) for testing of ADC IPs (intellectual property) are presented in this paper.
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