Reduction of oscillator strength due to piezoelectric fields in G a N / A l x Ga 1 − x N quantum wells
TL;DR: In this paper, the authors demonstrate a dramatic reduction of the oscillator strength in quantum wells due to piezoelectric fields, showing a strong increase of the luminescence decay time of the dominating transition with increasing well width in parallel to a redshift of the emission peaks.
Abstract: We demonstrate a dramatic reduction of the oscillator strength in ${\mathrm{G}\mathrm{a}\mathrm{N}/\mathrm{A}\mathrm{l}}_{x}{\mathrm{Ga}}_{1\ensuremath{-}x}\mathrm{N}$ quantum wells due to piezoelectric fields. Our study using time-resolved photoluminescence spectroscopy reveals a strong increase of the luminescence decay time of the dominating transition with increasing well width by several orders of magnitude in parallel to a redshift of the emission peaks. The experimental results are consistently explained by a quantitative model based on the piezoelectric fields in strained wurtzite quantum wells. We estimate the piezoelectric constant of GaN to ${d}_{31}=\ensuremath{-}0.9\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}10}$ cm/V.
Citations
More filters
TL;DR: Chakraborty et al. as discussed by the authors presented growth orientation dependence of the piezoelectric polarization of InxGa1−xN and AlyGa 1−yN layers matched to GaN and showed that the zero crossover has only a very small dependence on the In or Al content of the ternary alloy layer.
Abstract: This paper presents growth orientation dependence of the piezoelectric polarization of InxGa1−xN and AlyGa1−yN layers lattice matched to GaN. This topic has become relevant with the advent of growing nitride based devices on semipolar planes [A. Chakraborty et al., Jpn. J. Appl. Phys., Part 2 44, L945 (2005)]. The calculations demonstrate that for strained InxGa1−xN and AlyGa1−yN layers lattice matched to GaN, the piezoelectric polarization becomes zero for nonpolar orientations and also at another point ≈45° tilted from the c plane. The zero crossover has only a very small dependence on the In or Al content of the ternary alloy layer. With the addition of spontaneous polarization, the angle at which the total polarization equals zero increases slightly for InxGa1−xN, but the exact value depends on the In content. For AlyGa1−yN mismatched layers the effect of spontaneous polarization becomes important by increasing the crossover point to ∼70° from c-axis oriented films. These calculations were performed u...
745 citations
TL;DR: In this paper, a phase separation of the InGaN layer was clearly observed in the emission spectra, in which blue and red emission peaks appeared, in terms of the temperature dependence of the LEDs.
Abstract: Highly efficient light-emitting diodes (LEDs) emitting ultraviolet (UV), blue, green, amber and red light have been obtained through the use of InGaN active layers instead of GaN active layers. Red LEDs with an emission wavelength of 675 nm, whose emission energy was almost equal to the band-gap energy of InN, were fabricated. The dependence of the emission wavelength of the red LED on the current (blue shift) is dominated by both the band-filling effect of the localized energy states and the screening effect of the piezoelectric field. In the red LEDs, a phase separation of the InGaN layer was clearly observed in the emission spectra, in which blue and red emission peaks appeared. In terms of the temperature dependence of the LEDs, InGaN LEDs are superior to the conventional red and amber LEDs due to a large band offset between the active and cladding layers. The localized energy states caused by In composition fluctuation in the InGaN active layer contribute to the high efficiency of the InGaN-based emitting devices, in spite of the large number of threading dislocations and a large effect of the piezoelectric field. The blue and green InGaN-based LEDs had the highest external quantum efficiencies of 18% and 20% at low currents of 0.6 mA and 0.1 mA, respectively.
717 citations
TL;DR: In this article, the crystal orientation dependence of piezoelectric fields in wurtzite strained Ga0.9In0.1N/GaN heterostructures was analyzed.
Abstract: We calculated the crystal orientation dependence of piezoelectric fields in wurtzite strained Ga0.9In0.1N/GaN heterostructures. The highest longitudinal piezoelectric field of 0.7 MV/cm can be generated in (0001)-oriented biaxial-strained Ga0.9In0.1N layer coherently grown on GaN. On the contrary, no longitudinal piezoelectric field is induced in strained layers grown along orientations at an off angle of 39° or 90° from (0001). The high symmetry planes with these angles are, for instance, (1124) and (1012) for 39°, and (1120) and (1010) for 90°. We also calculated the crystal orientation dependence of the transition probability in a 3-nm strained Ga0.9In0.1N/GaN quantum well, which indicated that the transition probability with these non-(0001) orientations becomes 2.3 times larger than that with the (0001) orientation. We conclude that high-performance strained nitride-based optical devices can be obtained by control of the crystal orientation.
514 citations
TL;DR: In this paper, structural characteristics of nonpolar (1120) a-plane GaN thin films grown on (1102) r-plane sapphire substrates via metalorganic chemical vapor deposition were described.
Abstract: In this letter we describe the structural characteristics of nonpolar (1120) a-plane GaN thin films grown on (1102) r-plane sapphire substrates via metalorganic chemical vapor deposition. Planar growth surfaces have been achieved and the potential for device-quality layers realized by depositing a low temperature nucleation layer prior to high temperature epitaxial growth. The in-plane orientation of the GaN with respect to the r-plane sapphire substrate was confirmed to be [0001]GaN‖[1101]sapphire and [1100]GaN‖[1120]sapphire. This relationship is explicitly defined since the polarity of the a-GaN films was determined using convergent beam electron diffraction. Threading dislocations and stacking faults, observed in plan-view and cross-sectional transmission electron microscope images, dominated the a-GaN microstructure with densities of 2.6×1010 cm−2 and 3.8×105 cm−1, respectively. Submicron pits and crystallographic terraces were observed on the optically specular a-GaN surface with atomic force m...
488 citations
TL;DR: The generated C-doped Bi3 O4 Cl has a noble-metal- and electron-scavenger-free water-oxidation ability under visible light, which is difficult to achieve with most existing photocatalysts.
Abstract: Incorporating carbon into Bi3 O4 Cl enhances its internal electric field by 126 times, which induces a bulk charge separation efficiency (ηbulk ) of 80%. This ultrahigh ηbulk value presents a state-of-the-art result in tuning the bulk charge separation. The generated C-doped Bi3 O4 Cl has a noble-metal- and electron-scavenger-free water-oxidation ability under visible light, which is difficult to achieve with most existing photocatalysts.
486 citations