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Journal ArticleDOI

Resistive switching behavior in oxygen ion irradiated TiO2-x films

TL;DR: In this article, the room temperature resistive switching behavior in 50 keV O+-ion irradiated TiO2−x layers at an ion fluence of 5 × 1016 ions cm−2 is reported.
Abstract: The room temperature resistive switching behavior in 50 keV O+-ion irradiated TiO2−x layers at an ion fluence of 5 × 1016 ions cm−2 is reported. A clear transformation from columnar to layered polycrystalline films is revealed by transmission electron microscopy with increasing ion fluence, while the complementary electron energy loss spectroscopy suggests an evolution of oxygen vacancy (OV) in TiO2−x matrix. This is further verified by determining electron density with the help of x-ray reflectivity. Both local and device current–voltage measurements illustrate that the ion-beam induced OVs play a key role in bistable resistive switching mechanism.
Citations
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Journal ArticleDOI
TL;DR: The environmentally friendly and uniform CsSnCl3 perovskite films are introduced to act as an active layer in the flexible memristors for the development of next-generation flexible electronics.
Abstract: Recently, several types of lead halide perovskites have been actively researched for resistive switching (RS) memory or artificial synaptic devices due to their current–voltage hysteresis along with the feasibility of fabrication, low-temperature processability and superior charge mobility. However, the toxicity and environmental pollution potential of lead halide perovskites severely restrict their large-scale commercial prospects. In the present work, the environmentally friendly and uniform CsSnCl3 perovskite films are introduced to act as an active layer in the flexible memristors. Ag/CsSnCl3/ITO devices demonstrate bipolar RS with excellent electrical properties such as forming free characteristics, good uniformity, low operating voltages, a high ON/OFF ratio (102) and a long retention time (>104 s). The RS mechanism has been well explained in the outline of electric field-induced formation and rupture of Ag filaments in the CsSnCl3 layer. The metallic nature of the conducting filament has been further confirmed by temperature-dependent variation of low and high resistance states. Additionally, various pulse measurements have been carried out to mimic some of the basic synaptic functions including postsynaptic current, paired-pulse facilitation, long-term potentiation and long-term depression under normal as well as bending conditions. Our work provides the opportunity for exploring artificial synapses based on lead-free halide perovskites for the development of next-generation flexible electronics.

41 citations

Journal ArticleDOI
TL;DR: In this paper, the HfO2/NiO nanocomposite films are fabricated by sol-gel spin-coating method to investigate the bending effect on resistive switching of p-n heterojunction.

11 citations

Journal ArticleDOI
TL;DR: In this article , a CsPb2Br5 film is applied as a switching layer to implement memory devices with a flexible all-inorganic halide-perovskite/ITO-PET structure.
Abstract: Despite the recent advancements in memory devices, the quest for building materials with low power consumption is still on, with the ultimate focus on the durability of the system and reliability and reproducibility of its performance. Halide perovskites (HPs), which have several intriguing photoelectrical traits, have recently been utilized for memory applications; one of the highlights of these materials is the ionic-motion-based fast switching in their crystal structure. In this work, a CsPb2Br5 film is applied as a switching layer to implement memory devices with a flexible Al/CsPb2Br5/ITO-PET structure. The device exhibits a pronounced bipolar resistive switching (RS) characteristic at low operating voltage. The as-fabricated flexible device presented RS features with no initial forming process, concentrated distributions of high and low resistance states (HRS and LRS), uniform switching, endurance over 100 cycles, and a long retention time of 103 s with a high on/off ratio of around 102. Multilevel data-storage capability was also observed via subtle control of the compliance current (CC). Considering the current demand for smart, wearable, and flexible electronic gadgets, the current-voltage (I-V) characteristics of the as-fabricated all-inorganic halide-perovskite-based memory device were further explored under different bending conditions to determine its electrical reliability and mechanical stability. This flexible device exhibited no discernible difference in device performance under flat or bent conditions, and the performance remained nearly the same even after 500 bending cycles. In addition to control of the RS effect of the device using an electrical field, the performance of the device under light was also explored. Blue light modulates the resistive states by regulating the condition of photo-generated electron-hole pairs, and the SET and RESET voltages are changed from 2.34 to 2.14 V and from -2.04 to -1.90 V, respectively. The observed RS behavior is explained on the basis of the creation and partial annihilation of conductive multifilaments, which is dominated by the migration of bromine ions and their associated vacancies in the HP layer. We believe that this work will offer a new context to understand the intrinsic characteristics of HPs for RS applications at low voltage and validate their potential in the design of next-generation stable and nonvolatile memory devices for future flexible electronic systems.

9 citations

References
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Journal ArticleDOI
01 May 2008-Nature
TL;DR: It is shown, using a simple analytical example, that memristance arises naturally in nanoscale systems in which solid-state electronic and ionic transport are coupled under an external bias voltage.
Abstract: Anyone who ever took an electronics laboratory class will be familiar with the fundamental passive circuit elements: the resistor, the capacitor and the inductor. However, in 1971 Leon Chua reasoned from symmetry arguments that there should be a fourth fundamental element, which he called a memristor (short for memory resistor). Although he showed that such an element has many interesting and valuable circuit properties, until now no one has presented either a useful physical model or an example of a memristor. Here we show, using a simple analytical example, that memristance arises naturally in nanoscale systems in which solid-state electronic and ionic transport are coupled under an external bias voltage. These results serve as the foundation for understanding a wide range of hysteretic current-voltage behaviour observed in many nanoscale electronic devices that involve the motion of charged atomic or molecular species, in particular certain titanium dioxide cross-point switches.

8,971 citations

Journal ArticleDOI
TL;DR: SRIM as discussed by the authors is a software package concerning the stopping of ion/atom collisions, and individual interatomic potentials have been included for all ion and atom collisions in the SRIM package.
Abstract: SRIM is a software package concerning the S topping and R ange of I ons in M atter. Since its introduction in 1985, major upgrades are made about every six years. Currently, more than 700 scientific citations are made to SRIM every year. For SRIM-2010 , the following major improvements have been made: (1) About 2800 new experimental stopping powers were added to the database, increasing it to over 28,000 stopping values. (2) Improved corrections were made for the stopping of ions in compounds. (3) New heavy ion stopping calculations have led to significant improvements on SRIM stopping accuracy. (4) A self-contained SRIM module has been included to allow SRIM stopping and range values to be controlled and read by other software applications. (5) Individual interatomic potentials have been included for all ion/atom collisions, and these potentials are now included in the SRIM package. A full catalog of stopping power plots can be downloaded at www.SRIM.org . Over 500 plots show the accuracy of the stopping and ranges produced by SRIM along with 27,000 experimental data points. References to the citations which reported the experimental data are included.

6,906 citations

Journal ArticleDOI
TL;DR: Experimental evidence is provided to support this general model of memristive electrical switching in oxide systems, and micro- and nanoscale TiO2 junction devices with platinum electrodes that exhibit fast bipolar nonvolatile switching are built.
Abstract: Nanoscale metal/oxide/metal switches have the potential to transform the market for nonvolatile memory and could lead to novel forms of computing. However, progress has been delayed by difficulties in understanding and controlling the coupled electronic and ionic phenomena that dominate the behaviour of nanoscale oxide devices. An analytic theory of the ‘memristor’ (memory-resistor) was first developed from fundamental symmetry arguments in 1971, and we recently showed that memristor behaviour can naturally explain such coupled electron–ion dynamics. Here we provide experimental evidence to support this general model of memristive electrical switching in oxide systems. We have built micro- and nanoscale TiO2 junction devices with platinum electrodes that exhibit fast bipolar nonvolatile switching. We demonstrate that switching involves changes to the electronic barrier at the Pt/TiO2 interface due to the drift of positively charged oxygen vacancies under an applied electric field. Vacancy drift towards the interface creates conducting channels that shunt, or short-circuit, the electronic barrier to switch ON. The drift of vacancies away from the interface annilihilates such channels, recovering the electronic barrier to switch OFF. Using this model we have built TiO2 crosspoints with engineered oxygen vacancy profiles that predictively control the switching polarity and conductance. Nanoscale metal/oxide/metal devices that are capable of fast non-volatile switching have been built from platinum and titanium dioxide. The devices could have applications in ultrahigh density memory cells and novel forms of computing.

2,744 citations