RGB speckle pattern interferometry for surface metrology
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139,059 citations
"RGB speckle pattern interferometry ..." refers methods in this paper
...The interferometric methods used to overcome such problems are: 2λ-phase shifting interferometry (2λ-PSI) [15-17], scanning white light interferometry (SWI)[18-20], spectrally resolved white light interferometry (SR-WLI) [21, 22], white light phase shifting interferometry[23-25], and 3λ-phase shifting interferometry (3λ-PSI) [26-28]....
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12,972 citations
"RGB speckle pattern interferometry ..." refers methods in this paper
...The interferometric methods used to overcome such problems are: 2λ-phase shifting interferometry (2λ-PSI) [15-17], scanning white light interferometry (SWI)[18-20], spectrally resolved white light interferometry (SR-WLI) [21, 22], white light phase shifting interferometry[23-25], and 3λ-phase shifting interferometry (3λ-PSI) [26-28]....
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383 citations
315 citations
"RGB speckle pattern interferometry ..." refers background in this paper
...Digital speckle pattern interferometry (DPSI) or TV holography (TVH) based on single wavelength configuration offers excellent resolution and high sensitivity for optical metrology applications [1-6]....
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309 citations