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Journal ArticleDOI

Simultaneous measurement of lateral and normal forces with an optical‐beam‐deflection atomic force microscope

Gerhard Meyer, +1 more
- 12 Nov 1990 - 
- Vol. 57, Iss: 20, pp 2089-2091
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TLDR
In this article, an atomic force microscope capable of measuring, simultaneously yet separately, lateral (frictional) and normal forces is described, and a direction-dependent feature, absent in topological images, is found when scanning stepped surfaces of NaCl(001) in ultrahigh vacuum.
Abstract
An atomic force microscope capable of measuring, simultaneously yet separately, lateral (‘‘frictional’’) and normal forces is described. A direction‐dependent feature, absent in topological images, is found when scanning stepped surfaces of NaCl (001) in ultrahigh vacuum. A simple model is presented to account for this observation.

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Citations
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Journal ArticleDOI

Nanotribology: friction, wear and lubrication at the atomic scale

TL;DR: In this paper, an understanding of the molecular mechanisms of tribology in thin films and at surfaces has been presented, which is of fundamental importance in many pure and applied sciences, such as computer simulations.
Journal ArticleDOI

Calibration of frictional forces in atomic force microscopy

TL;DR: In this article, an in situ experimental procedure is presented to determine the response of a cantilever to lateral forces in terms of its normal force response using optical lever deflection sensing.
Journal ArticleDOI

Friction measurements on phase-separated thin films with a modified atomic force microscope

TL;DR: In this paper, a friction force microscope was used to image and identify compositional domains with a resolution of ∼5 A. Although the topography of the individual domains can be imaged with a standard atomic force microscope, it is the additional information provided by the friction measurement that allows them to be chemically differentiated.
Journal ArticleDOI

Chemical force microscopy

TL;DR: Modification of force microscope probe tips by covalent linking of organic monolayers that terminate in well-defined functional groups enables direct probing of molecular interactions and imaging with chemical sensitivity.
References
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Journal ArticleDOI

Atomic force microscope

TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
Journal ArticleDOI

Tip Surface Interactions in STM and AFM

TL;DR: In this paper, the interaction between tip and flat surface in the STM and AFM is reviewed and a new, AC method to determine the absolute value of area of contact and interaction is presented.
Journal ArticleDOI

Optical‐beam‐deflection atomic force microscopy: The NaCl (001) surface

TL;DR: In this paper, an optical-beam-deflectin force microscope operating in the short-range repulsive regime was used to imaged the surface of NaCl in ultrahigh vacuum.
Journal ArticleDOI

Structural and dynamical consequences of interactions in interfacial systems

TL;DR: In this paper, a review of molecular dynamics simulations for studies of the energetics and dynamical response of materials to external mechanical perturbations is presented, and applications to investigations of solid and liquid interfacial systems under stress and to studies of tip-substrate interactions in atomic force microscopy are demonstrated.
Journal ArticleDOI

Evaporation rate of NaCl in a vacuum

TL;DR: In this article, the evaporation of NaCl in a vacuum was investigated in the temperature range of 300 to 700°C in the optical and electron microscope in the case of spiral turns.
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