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Proceedings ArticleDOI

SOI FinFET compact model for RF circuits simulation

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TLDR
A methodology to properly establish an accurate SOI FinFET compact model through SPICE simulator is presented and the comparison between the simulated and measured performance of a Low Noise Amplifier demonstrates the validity and the capabilities of this compact model to simulate the dc and RF behavior of RF circuits.
Abstract
A methodology to properly establish an accurate SOI FinFET compact model through SPICE simulator is presented. This compact model is implemented in Verilog-A to simulate the performance of RF circuits based on SOI FinFET technology. It predicts well static behavior of the transistor and circuit, as well as their small-signal RF behavior by modeling the intrinsic capacitances and also the effects of the gate resistance and the extrinsic gate capacitances. Finally, the comparison between the simulated and measured performance of a Low Noise Amplifier demonstrates the validity and the capabilities of this compact model to simulate the dc and RF behavior of RF circuits.

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Journal ArticleDOI

Influence of Different Fin Configurations on Small-Signal Performance and Linearity for AlGaN/GaN Fin-HEMTs

TL;DR: In this article, a detailed RF investigation on small-signal model parameters is performed under different biasing conditions, and the influence of different fin structures on model parameters and linearity improvement is examined.
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A temperature characterization of (Si-FinFET) based on channel oxide thickness

TL;DR: In this paper, the authors present the temperature-gate oxide thickness characteristics of a fin field effect transistor (FinFET) and discuss the possibility of using such a transistor as a temperature nano-sensor.
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Small signal model and analog performance analysis of negative capacitance FETs

TL;DR: Results show that if pushed for a higher intrinsic gain via thicker Fe layers in NCFETs, the linearity of the device suffers, which reveals inherent device level trade-off in NCfETs for analog circuit performance.
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A Novel Small-Signal Model for Bulk FinFETs Accommodating Self-Heating Behaviors

TL;DR: In this article, a novel small-signal model for bulk FinFETs is presented, where a parallel combination of resistance-inductance networks originated from self-heating is obtained.
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Effects of downscaling channel dimensions on electrical characteristics of InAs-FinFET transistor

TL;DR: In this paper, the impact of downscaling of nano-channel dimensions of Indium Arsenide Fin Feld Effect Transistor (InAs- FinFET) on electrical characteristics of the transistor, in particular; (i) ION/IOFF ratio, (ii) Subthreshold Swing (SS), Threshold voltage (VT), and Drain-induced barrier lowering (DIBL).
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