Studies on crystallization of electroless NiP deposits
TL;DR: In this article, the X-ray line profile analysis, differential scanning calorimetry and microhardness of nickel-phosphorus deposits were used to study the crystallization process of these deposits.
About: This article is published in Journal of Materials Processing Technology.The article was published on 1996-01-01. It has received 130 citations till now. The article focuses on the topics: Crystallite & Crystallization.
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TL;DR: In this paper, Ni-P films with a thickness of 120 nm to 3 lm are deposited by electroless plating, whereas thicker films (5-26 lm) are obtained by subsequent electrodeposition of a pure Ni layer.
185 citations
TL;DR: In this paper, the ternary Ni-M-P and Ni-W-P alloy was synthesized from an acidic electroless bath and chemical analysis showed that tungsten incorporation reduced the phosphorus content in the deposit.
177 citations
TL;DR: In this article, the effect of the substrate microstructure and roughness on the deposition rate, nucleation, and mechanical properties of Ni-plating on Mg alloy AZ91 has been investigated.
Abstract: Electroless Ni-plating on Mg alloy AZ91 has been studied to understand the effect of the substrate microstructure and roughness on the deposition rate, nucleation, coating microstructure, and mechanical property of the coatings. Experimental results indicate that the growth of Ni deposit in the early stage was influenced by the substrate microstructure and roughness. The electroless Ni-plating on the abrasive blasted AZ91 (rough) substrate showed a higher deposition rate than that on the finely polished one, indicating that the mechanical roughening enhances the nucleation and coalescence of Ni crystallites. Scratching tests showed that higher coating adhesion is achieved on the roughened AZ91 substrate. Wear tests, however, showed that the Ni plating on the rough substrate has a higher friction coefficient than that on the polished surface. The hardness and adhesion property of Ni coatings before and after heat treatment were also characterised.
167 citations
TL;DR: In this paper, a Ni-P-CNT composite coating was successfully deposited on the surface of copper by electroless plating and X-ray diffraction (XRD) analysis and scanning electron microscopy (SEM) were used to characterize the coatings.
137 citations
TL;DR: In this article, the structural characteristics and phase transformation behavior of plain electroless Nix2013,P coating and TiO2 composite coatings are investigated. And the authors conclude that the incorporation of Si 3N4, CeO2 andTiO2 particles in the Nix 2013,P matrix does not have any influence on the structure and phase-transformation behavior of the plain ENix2013;P coatings.
134 citations
References
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TL;DR: The use of the Voigt function for the analysis of the integral breadths of broadened X-ray diffraction line profiles forms the basis of a rapid and powerful single-line method of crystallite size and strain determination which is easy to apply.
Abstract: The use of the Voigt function for the analysis of the integral breadths of broadened X-ray diffraction line profiles forms the basis of a rapid and powerful single-line method of crystallite-size and strain determination which is easy to apply. To avoid graphical methods or interpolation from tables, empirical formulae of high accuracy are used and an estimation of errors is presented, including the influence of line-profile asymmetry. The method is applied to four practical cases of size-strain broadening: (i) cold-worked nickel, (ii) a nitrided steel, (iii) an electrodeposited nickel layer and (iv) a liquid-quenched AlSi alloy.
1,085 citations
TL;DR: In this paper, the authors compared the performance of six profile functions, including the pseudo-Voigt and Pearson VII, in Rietveld refinements with fixed-angle or fixed-wavelength powder diffraction data, obtained with neutrons or with X-rays.
Abstract: Reflection profile functions used or suggested for use in Rietveld refinements with fixed-angle or fixed-wavelength powder diffraction data, obtained with neutrons or with X-rays, are reviewed briefly. The fixed-wavelength X-ray case is considered in detail. In tests of fitting to individual resolved reflection profiles, at least eight different profile functions, including some representations consisting of "learned' differentiable number arrays, have been show to be satisfactory at the less than 3% misfit level. Several authors have made comparative studies of subsets of the six analytic functions, Gaussian (G), Lorentzian (L), modified Lorentzian (ML), intermediate Lorentzian (IL), pseudo-Voigt (p-V), and Pearson VII (PVII). In this work, the performance of all six, in Rietveld refinements with data sets from seven different specimens with differing degrees of broadening, have been intercompared on the basis of difference plots, Rwp, and RB. The Gaussian function was consistently the worst performer, while the pseudo-Voigt and Pearson VII were the best. For this reason, for reasons of simplicity, and for convenient though crude physical interpretation of the Lorentz-fraction parameter, the pseudo-Voigt is identified as the function of choice among these six. It is emphasized that a need still exists for a better profile function soundly based on physical reality.
785 citations
TL;DR: In this article, the authors extended the whole-powder-pattern fitting procedure without reference to a structural model to analyze X-ray whole powder data and found that the correction for peak shift has a large influence on the overall fit of the pattern and the accuracy of refined parameters.
Abstract: The procedure of whole-powder-pattern fitting without reference to a structural model, first proposed by Pawley for use with neutron powder data [J. Appl. Cryst. (1981). 14, 357–361], was extended as a tool for analyzing X-ray whole-powder data. X-ray data for α-SiO2, α-Al2O3 and CaCO3 used as test samples were first analyzed by individual profile-fitting techniques to establish the angle-dependent profile-shape model. Then the results were incorporated into the profile model of whole-powder-pattern fitting, where peak maximum positions of individual reflections are a function of unit-cell parameters while integrated intensities are independent variables. Whole-powder-pattern fits for the test samples showed that the correction for peak shift has a large influence on the overall fit of the pattern and the accuracy of refined parameters. It is also important to take into account the asymmetry and the angular dependence of the intensity decay rate in modelling the diffraction profile. The method developed was applied to an analysis of the powder pattern of a mixed monoclinic tetragonal ZrO2.
480 citations
TL;DR: In this paper, it is shown that the current status of the least-squares profile-refinement method, for the determination of crystal structures from X-ray and neutron powder diagrams, allows the simultaneous determination of crystallite-size and lattice-strain parameters.
Abstract: It is shown that the current status of the least-squares profile-refinement method, for the determination of crystal structures from X-ray and neutron powder diagrams, allows the simultaneous determination of crystallite-size and lattice-strain parameters. As profile-shape functions the Voigt, pseudo-Voigt and Pearson VII functions are considered. Formulae are obtained enabling structure refinement and size-strain analysis in the same computer run.
273 citations
TL;DR: In this paper, a study of microstructures and crystallization of the electroless Ni-P deposits containing 11.3 to 23.0 at% P obtained from acidic nickel sulphate baths with sodium hypophosphite as a reducing agent by means of differential scanning calorimetry, X-ray diffractometry and hot stage transmission electron microscopy.
Abstract: A study has been made of microstructures and crystallization of the electroless Ni-P deposits containing 11.3 to 23.0 at% P obtained from acidic nickel sulphate baths with sodium hypophosphite as a reducing agent by means of differential scanning calorimetry, X-ray diffractometry and hot stage transmission electron microscopy. The deposits containing low phosphorus content of 11.3 at% could be represented as an fcc Ni-P solid solution of 5 to 10 nm microcrystallites, whereas the deposits containing high phosphorus content were amorphous. The crystallization process of amorphous Ni-P solution involved more than one intermediate phases; precrystallized nickel or off-stoichiometric Ni3(P, Ni) or Ni5(P, Ni)2 phase in which some phosphorus sites are replaced by nickel atoms. The final equilibrium phases were bct Ni3P and fcc nickel crystals regardless of phosphorus content. The amorphous phase containing 20 to 22 at% phosphorus was the most stable among the amorphous Ni-P alloys.
179 citations