Testing for Bridging Faults
Citations
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Cites background or methods from "Testing for Bridging Faults"
...A FBF can potentially turn a combinatorial circuit into a sequential one [ 10 ]....
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...According to [ 10 ], between 40% and 50% of all faults can be modeled with the BF model....
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...Pull-up and pull-down strength depends on the used technology, transistor size and on the count of the conducting tranistors [ 10 ]....
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...The MBF can simplified be seen as several SBFs with common lines [ 10 ]....
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References
248 citations
"Testing for Bridging Faults" refers background in this paper
...[ 2 ] most of the MBFs are detected by tests for component SBFs, therefore most of the work...
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...lations [ 2 ] which are hard to detect by the testing equipment....
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...In [ 2 ] has been shown that, for fan-out free circuits, SSF tests can detect several classes...
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98 citations
"Testing for Bridging Faults" refers background or methods in this paper
...Bridging faults (BFs) are caused by shorts between normally unconnected signal lines (Fi- gure 1.a), [ 1 ]....
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...used. Most of the work done in this area uses simple wired models [ 1 ]-[3], [6]....
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...then of the same order of magnitude as the number of SSFs as shown in [ 1 ]....
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...set for SSFs, thus explicit enumeration of all BFs is avoided. In [ 1 ] an implicit simulation meth-...
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96 citations
20 citations
"Testing for Bridging Faults" refers methods in this paper
...Later, in [ 6 ], the authors use a two-state sequential machine model (Mealey) to conclude...
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...used. Most of the work done in this area uses simple wired models [1]-[3], [ 6 ]....
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