The impact of three-dimensional morphological changes and local properties induced by plasma treatment on polyimide films at the interface with some electronic components
04 Dec 2014-pp 789-792
TL;DR: In this paper, the morphological features and local properties of an semi-alicyclic polyimide film were closely evaluated by atomic force microscopy (AFM), in order to increase their suitability for electronic purposes.
Abstract: The morphological features and local properties of an semi-alicyclic polyimide film were closely evaluated by atomic force microscopy (AFM). These characteristics were optimized by applying high frequency plasma treatment, in order to increase their suitability for electronic purposes. Starting from the surface texture parameters, a deep analysis of the surface topographies at the interface with certain compounds was performed. The action of the plasma species generates a prevalent granular surface morphology, with higher roughness, improved bearing characteristics and minimal surface orientation. In addition, after the plasma treatment, a greater interaction between the AFM silicon tip and the polyimide film occurred, reflecting an increased surface adhesion. The obtained data reveal that the processed semi-alicyclic polyimide exhibits optimal features for microelectronic applications such as silicon/polyimide interfaces for flexible electronics.
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TL;DR: In this paper, the acquisition and use of digital images in a wide variety of scientific fields is discussed. But the focus is on high dynamic range imaging in more than two dimensions.
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3,017 citations
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19 Dec 2012
94 citations
"The impact of three-dimensional mor..." refers background in this paper
...Polyimides represent a special class of high performance synthetic polymers, characterized by chemical resistance, low dielectric constant, stability at elevated temperatures, low thermal expansion, good optical transparency, high adhesion and dimensional stability [1]....
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TL;DR: In this paper, the effect of several variables on the absorption of moisture were monitored in polyimide films adhered to polished silicon substrates, including total dry film thickness, exposure time, and the contribution of a coupling agent.
Abstract: Water absorption in thin films (<1000 A) of a commercial polyimide was evaluated by monitoring dimensional changes induced by a humid environment. Film thickness was measured using x-ray reflectivity, which is a nondestructive technique offering angstrom resolution in the measurements of thin film or multilayer thickness. The effect of several variables on the absorption of moisture were monitored in polyimide films adhered to polished silicon substrates, including total dry film thickness, exposure time, and the contribution ofa coupling agent. The percentage increase in film thickness due to moisture uptake is found to be a weak function of dry film thickness, decreasing as dry film thickness increases, and to be somewhat affected by the use of an interfacial coupling agent. The observed behavior points to the polymer/substrate interface as a strong factor controlling the absorption of moisture in the polyimide/ silicon system, and is believed to reflect the presence of a highly moisture-saturated interfacial layer. A bilayer model is proposed, and the feasibility of using this model to describe the observed behavior is considered.
40 citations
"The impact of three-dimensional mor..." refers background in this paper
...Polyimide film in electronic systems is often brought in contact with a numerous inorganic materials, including the silicon [2]....
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TL;DR: In this paper, the phase shift in amplitude-controlled dynamic atomic force microscopy (AFM) is shown to depend on the cantilever-sample tilt angle, which contributes to the overall energy dissipation.
Abstract: The phase shift in amplitude-controlled dynamic atomic force microscopy (AFM) is shown to depend on the cantilever-sample tilt angle. For a silicon sample and tip the phase shift changes by nearly 15° for a change in tilt angle of 15°. This contribution to the phase results from the oscillating tip’s motion parallel to the surface, which contributes to the overall energy dissipation. It occurs even when the measurements are carried out in the attractive regime. An off-axis dynamic AFM model incorporating van der Waals attraction and a thin viscous damping layer near the surface successfully describes the observed phase shifts. This effect must be considered to interpret phase images quantitatively.
37 citations
"The impact of three-dimensional mor..." refers background in this paper
...Before plasma treatment, the low value of the average roughness parameter (Sa), calculated as the arithmetic mean of the absolute distances of the surface points from the mean plane [10,11], arise from the manner in which the polymer chains are...
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23 Jan 2013
TL;DR: The universal character of repulsive forces between the tip and the sample, which are employed for surface analysis in AFM, enables examination of even single polymer molecules without disturbance of their integrity as discussed by the authors.
Abstract: Atomic force microscopy is a powerful characterization tool for polymer science, capable of revealing surface structures with superior spatial resolution [1]. The universal character of repulsive forces between the tip and the sample, which are employed for surface analysis in AFM, enables examination of even single polymer molecules without disturbance of their integrity [2]. Being initially developed as the analogue of scanning tunneling microscopy (STM) for the high-resolution profiling of non-conducting surfaces, AFM has developed into a multifunctional technique suitable for characterization of topography, adhesion, mechanical, and other properties on scales from tens of microns to nanometers [3].
21 citations