The Surface Intensity of Fluorescence Excited in a Turbid Medium
TL;DR: In this article, a quantitative relationship for the fluorescent intensity observed from either side of a plane parallel sheet of turbid material, has been derived based upon the simplified theory of Kubelka and Munk.
Abstract: Based upon the simplified theory of Kubelka and Munk a quantitative relationship for the fluorescent intensity, observed from either side of a plane parallel sheet of turbid material, has been derived. The fluorescing substance is assumed to be uniformly distributed throughout the bulk of the medium. The results obtained show that fluorescence measurements from either side have good linearity over a very wide range of concentrations of fluorescing substance. Measurements from either side are very nearly equivalent in this regard. As expected, the fluorescent intensity observed at the illuminated surface is higher than that observed at the exit plane. The results are intended mainly for use in the quantitative analysis of fluorescent substances dispersed in a turbid medium. Typical applications are thin-layer chromatography and electrophoresis.
Citations
More filters
69 citations
TL;DR: In this paper, new expressions were derived from Kubelka-Munk theory to describe the Raman intensities observed by back-scattering from powder samples, and the predicted intensity dependences were compared with the results of experiment.
35 citations
TL;DR: In this paper, a theoretical analysis of the performance of photometric methods for the quantitative evaluation of thin-layer chromatograms using fluorescence is presented, which is considered as an extension of straight photodensitometry into the UV without requiring UV secondary optics nor UV sensitive photodetectors.
20 citations
TL;DR: In this paper, the relative merits of transmittance and reflectance procedures in the photodensitometric analysis of substances separated on thin-media chromatograms were compared.
15 citations
11 citations
References
More filters
TL;DR: In this paper, the inherent wavelength conversion in fluorescence analysis, the measuring signal is much less affected by optical background noise than is the case in absorptiometric measurements by both transmittance or reflectance procedures.
18 citations
TL;DR: The optical radiation transfer of plane parallel isotropic scattering media is for many purposes of technical importance adequately described by the Kubelka and Munk equations and by a simple substitution these can be converted to the set of equations describing an electrical transmission line with resistive parameters.
Abstract: The optical radiation transfer of plane parallel isotropic scattering media is for many purposes of technical importance adequately described by the Kubelka and Munk equations. By a simple substitution these can be converted to the set of equations describing an electrical transmission line with resistive parameters. Consequently, such a line can be used to simulate the optical transfer of the medium. For practical purposes the continuous line may be replaced by the series connection of lumped parameter sections. Both transmittance and reflectance of the optical medium can be determined from voltage and current measurements on the model. The model can then be used to invert the transfer equations in terms of incremental absorbance as required in photometric or reflectometric analysis of thin-layer chromatograms, electrophoretograms, etc.
9 citations