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NASA
-1WOMWEAMor-
Technical Memorandum 80092
THERMAL DETECTORS AS
X-RAY SPECTROMETERS
(NASA;-TM-86092) THERMAL DETECTORS AS X-RAY
N84-23866
SPECTROMETERS (NASA) 27 p HC A03/MF A01
CSC.L 14B
Unclas
G3/35 191:9
9
S.H. Moseley, J.C. Mather, and
D. McCammon
APRIL 1984
National Aeronautics and
Space Administration
Goddard Space Flight Center
Greenbelt, Maryland 20771
f
r
d
thermal Detectors as
X
-Ray
Spectrometers
S. H. Moseley
J. C. Mather
Goddard Space Flight Center
Greenbelt,, MD
20771
D. Mc Camnmon
Department of Physics
University of Wisconsin
Madison, WI 53706
Abstract
We show that sensitive thermal detectors should be useful for
measuring very small energy pulses, such as those produced by the
absorption of x-ray photons.
The measurement uncertainty can be very
small , making the technique promising for high resolution nondispersive
x-ray spectroscopy.
We derive the limits to the energy resolution of such thermal
detector
,
5
.
We use these to find the resolution to be expected for a
detector suitable for x-ray spectroscopy in the 100-10,000 eV range.
If
there is no noise in the thermalization of the x-ray, resolution better
than 1 eV full width at half maximum (FWM) is possible for detectors
operating at 0.1 K.
Energy .loss in the conversion of the photon energy to heat is a
potential problem.
Statistical fluctuations of lost energy would reduce
the energy resolution of the detector.
The loss mechanisms may include
emission if photons or electrons, or the trapping of energy in long-lived
metastable states. Fluctuations in the phonon spectrum could also limit
the resolution if phonon relaxation times are very long.
We give
conceptual solut. ons for each of these possible problems.
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I. Introduction
An ultimate goal for any spectrometer is to offer high resolving power
and throughput simultaneously over a wide energy range.
Silicon solid
state diode detectors used as x-ray spectrometers have good efficiency but
their resolution is only 100-200 eV. Wavelength dispersive spectrometers
offer resolution < 10 eV, but have low throughputs.
A thermal detector
operating at cryogenic temperatures can offer the high efficiency of the
solid state detector and resolution comparable to that of dispersive
spectrometers.
Bolometers have been used for many years as infrared detectors (Low,
1961) . Recent work
102,3
shows that at temperatures as low as 0.32 K, the
dominant noise in properly constructed devices is due to the thermodynamic
fluctuations in the device itself'.
The energy sensitivity of a thermal detector scales as T/T where T is
the operating temperature and C the detector heat capacity.
Practical
designs for detectors can be made using the substantial body of low temper-
ature data existing in the literature. An operating temperature of 0.1 K
has been chosen as the design temperature because it permits the desired
resolution, and it can easily be achieved with an adiabatic demagnetization
refrigerator operating with a 2 K heat sink. Also, experimental data show
that the heat capacities of many of our candidate materials decline quite
slowly or actually increase below 0. 1 K.
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t-
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We will demonstrate that the noise
in
the front end
amplifier junction
field effect transistor
CJFET)
and load resistor
need not seriously affect
the resolution.
The performance of a bolometer as an x-ray spectrometer depends on the
noiseless conversion of the x-ray to heat. If some fraction of
the energy
is
lost,
that fraction need not be exactly constant from photon to photon.
This will degrade the resolution of the spectrometer.
We will discuss
potential loss mechanisms and techniques for combatting them.
II. Theory of Operation
r
A typical bolometer detector has three parts: an energy absorber, a
semiconducting thermometer, and a support structure to carry away the
i
applied heat and establish electrical contact to the thermometer. A design
f
for such a detector is given in Figure 1 and discussed in Section TV. The
detector temperature is measured by applying a DC bias voltage to the
series combination of the thermometer and a load resistor. 9nall varia-
tions in the thermistor voltage are measured using a low noise amplifier,
whose first stage is usually a JFET source follower mounted near the
detector but operating at about 80 K.
The basic Theory
of
these detectors has been summarized.
4,5
A more
complete theory has been given by Mather,
6
and optimization for their use
as power detectors has been carried out.7
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