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Thermal Modeling, Analysis, and Management in VLSI Circuits: Principles and Methods Maximum chip performance under peak permissible temperature limits may be achieved with the help of combined electrical and thermal simulation of VLSI circuits.
Massoud Pedram,Shahin Nazarian +1 more
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In this article, the authors present a brief discussion of key sources of power dissipation and their temperature relation in CMOS VLSI circuits, and techniques for full-chip temperature calculation with special attention to its implications on the design of high-performance, low-power very large scale integration (VLSI) circuits.Abstract:
The growing packing density and power con- sumption of very large scale integration (VLSI) circuits have made thermal effects one of the most important concerns of VLSI designers. The increasing variability of key process parameters in nanometer CMOS technologies has resulted in larger impact of the substrate and metal line temperatures on the reliability and performance of the devices and interconnec- tions. Recent data shows that more than 50% of all integrated circuit failures are related to thermal issues. This paper presents a brief discussion of key sources of power dissipation and their temperature relation in CMOS VLSI circuits, and techniques for full-chip temperature calculation with special attention to its implications on the design of high-performance, low-power VLSI circuits. The paper is concluded with an over- view of techniques to improve the full-chip thermal integrity by means of off-chip versus on-chip and static versus adaptive methods.read more
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Journal ArticleDOI
I and i
TL;DR: There is, I think, something ethereal about i —the square root of minus one, which seems an odd beast at that time—an intruder hovering on the edge of reality.
Nanoscale thermal transport. II. 2003–2012
David G. Cahill,Paul V. Braun,Gang Chen,David R. Clarke,Shanhui Fan,Kenneth E. Goodson,Pawel Keblinski,William P. King,Gerald D. Mahan,Arun Majumdar,Humphrey J. Maris,Simon R. Phillpot,Eric Pop,Li Shi +13 more
TL;DR: In this article, a review of thermal transport at the nanoscale is presented, emphasizing developments in experiment, theory, and computation in the past ten years and summarizes the present status of the field.
Proceedings ArticleDOI
Thermal-induced leakage power optimization by redundant resource allocation
Min Ni,Seda Ogrenci Memik +1 more
TL;DR: It is shown that there is a power density, hence, temperature, at which the total leakage power will reach its optimal value, and such an optimal resource number can be a better starting point for the subsequent switching-driven low power binding.
Dissertation
Modèles compacts électro-thermiques du premier ordre et considération de bruit pour les circuits 3D
TL;DR: In this article, a methode de conception globale for le circuit integre 3D dans le domaine electrique, thermique, electrothermique et aussi le bruit is presented.
Dissertation
Graphene Heat Spreaders for Electronics Thermal Management Applications
TL;DR: In this paper, thermal chemical vapor deposition (TCVD), liquid phase exfoliation (LPE) from graphite, and reduction of graphene ox- ide (GO) were used to synthesize graphene, and transfer methods were also demonstrated.
References
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Proceedings ArticleDOI
Wattch: a framework for architectural-level power analysis and optimizations
TL;DR: Wattch is presented, a framework for analyzing and optimizing microprocessor power dissipation at the architecture-level and opens up the field of power-efficient computing to a wider range of researchers by providing a power evaluation methodology within the portable and familiar SimpleScalar framework.
Book
Fundamentals of Modern VLSI Devices
Yuan Taur,Tak H. Ning +1 more
TL;DR: In this article, the authors highlight the intricate interdependencies and subtle tradeoffs between various practically important device parameters, and also provide an in-depth discussion of device scaling and scaling limits of CMOS and bipolar devices.
Proceedings ArticleDOI
Dynamic thermal management for high-performance microprocessors
David Brooks,Margaret Martonosi +1 more
TL;DR: This work investigates dynamic thermal management as a technique to control CPU power dissipation and explores the tradeoffs between several mechanisms for responding to periods of thermal trauma and the effects of hardware and software implementations.
Journal ArticleDOI
CMOS scaling into the nanometer regime
Yuan Taur,Douglas A. Buchanan,Wei Chen,David J. Frank,Khalid EzzEldin Ismail,Shih-Hsien Lo,George Anthony Sai-Halasz,R. Viswanathan,Hsing-Jen Wann,Shalom J. Wind,Hon-Sum Philip Wong +10 more
TL;DR: In this article, the key challenges in further scaling of CMOS technology into the nanometer (sub-100 nm) regime in light of fundamental physical effects and practical considerations are discussed, including power supply and threshold voltage, short-channel effect, gate oxide, high-field effects, dopant number fluctuations and interconnect delays.
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