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Journal ArticleDOI

Time-resolved switching analysis of a ferroelectric liquid crystal by snapshot Mueller matrix polarimetry

TL;DR: An experimental snapshot Mueller matrix polarimeter based on wavelength polarization coding is used to get a time-resolved description of electric-field-induced fast transition within a ferroelectric liquid-crystal cell.
Abstract: An experimental snapshot Mueller matrix polarimeter based on wavelength polarization coding is used to get a time-resolved description of electric-field-induced fast transition within a ferroelectric liquid-crystal cell. The parameters extracted from experimental Mueller matrices are linked to the molecule director distribution to further determine the average trajectory and the collective behavior of these molecules while they switch over to another state.

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HAL Id: hal-00473906
https://hal.univ-brest.fr/hal-00473906
Submitted on 16 Apr 2010
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publics ou privés.
Time-resolved switching analysis of a ferroelectric liquid
crystal by snapshot Mueller matrix polarimetry
Matthieu Dubreuil, Sylvain Rivet, Bernard Le Jeune, Laurent Dupont
To cite this version:
Matthieu Dubreuil, Sylvain Rivet, Bernard Le Jeune, Laurent Dupont. Time-resolved switching anal-
ysis of a ferroelectric liquid crystal by snapshot Mueller matrix polarimetry. Optics Letters, Optical
Society of America - OSA Publishing, 2010, 35 (7), pp.1019-1021. �hal-00473906�

1
Time-resolved switching analysis of a ferroelectric liquid
crystal by Snapshot Mueller Matrix Polarimetry
Matthieu Dubreuil
1,2
, Sylvain Rivet
1,2
, Bernard Le Jeune
1,2
and Laurent Dupont
3
1) Université Européenne de Bretagne, France
2) Université de Bretagne Occidentale, Laboratoire de Spectrométrie et Optique Laser (EA 938),
6 Avenue le Gorgeu, C.S. 93837, 29238 Brest Cedex, France
3) Telecom Bretagne, Département d’Optique (UMR CNRS 6082), Technopôle Brest-Iroise,
C.S. 83818, 29238 Brest Cedex, France
*Corresponding author: matthieu.dubreuil@univ-brest.fr
An experimental snapshot Mueller Matrix polarimeter based on wavelength
polarization coding is used to get a time-resolved description of electric field-induced fast
transition within a ferroelectric liquid crystal cell. The parameters extracted from
experimental Mueller matrices are linked to the molecule director distribution to further
determine the average trajectory and the collective behavior of these molecules while they
switch over to another state. © 2009 Optical Society of America.
OCIS codes: 120.5410, 160.3710, 230.5440, 260.5430.
Mueller matrix (MM) polarimetry is usually employed to characterize samples that show
depolarization, birefringence and dichroism. For a more complete characterization, MMs are
coupled with variables such as wavelength, space coordinates, wave vector. To our knowledge,

2
little has been done with time as variable, though a temporal monitoring of MMs could permit
the study of fast polarization dynamics and widen the scope of MM polarimetry. Such
measurements require a device allowing the acquisition of a full MM in a very short time.
The principle of the Snapshot Mueller Matrix Polarimeter (SMMP) developed by our
team and based on wavelength polarization coding [1,2] is that the polarization states are
encoded in the spectral domain through use of a broadband source and high-order retarders [3].
On condition to use a well-suited retarder-thickness configuration, the full MM of a sample is
available in a single spectrum, I(λ), measured with a dispersive detection system (spectrometer
and CCD camera). As the acquisition time only depends on the aperture time of the CCD
camera, it can be very short (about 1 µs, here). This Letter is aimed at demonstrating the
potentiality of the SMMP to give a time-resolved description of electric field-induced fast
switching in a ferroelectric liquid crystal (FLC) cell. To our knowledge, only two teams have
performed time-resolved MM polarimetry on liquid crystals [4,5]. But, the polarimeters in use
were sequential, so the MMs were reconstructed from various input and output polarization
states and multiple synchronized acquisitions. The SMMP can acquire a full MM in a single
shot.
The SMMP described in Fig. 1 is composed of a broadband source (SLD from
B&W Tek, Inc) around λ
0
= 830 nm with ∆λ = 15 nm, a linear polarizer oriented at 0°, two
calcite retarders (n = 0.166) of thickness e = 2.08 mm respectively oriented at 45° and 0°, two
calcite retarders of thickness 5e = 10.4 mm respectively oriented at and 45°, a linear polarizer
oriented at 90°, a diffraction grating (1200 grooves/mm covering 10 nm) and a CCD camera
(512 x 512 pixels). The signal I(λ) is periodic and composed of several frequencies. With this
retarder-thickness configuration (e,e,5e,5e), 13 frequencies are generated on the analysis

3
window. The coefficients of a MM (m
ij
) are retrieved through application of a Fourier transform
to I(λ) since they are linked to the magnitudes of the Fourier peaks through relationships that
only depend on the retarder-thicknesses configuration [1]. By application of the calibration
procedures described in [2], the accuracy on the m
ij
coefficients (normalized by m
00
) is below
0.03 for measurements of well-known media (polarizer, wave-plate).
The chiral liquid crystal (LC) material under study is Felix 015/100, which has a
birefringence around 0.16 in the visible/NIR. Two glass plates with transparent ITO electrodes
and with a thin film of rubbed polyimide, produced by spin coating, are used to fabricate the cell.
Its gap, obtained by spraying of spacers, is about 1.6 µm. The cell is then filled by capillary
suction and the LC is confined between both plates in planar orientation which means that the
LC molecules are parallel to the substrate. At room temperature (25°C), this LC is in the smectic
C* phase, where the molecular layers are perpendicular to the rubbing direction. The average
orientation of molecule is specified by the unit vector
n
r
, called the director (Fig. 2). The director
is tilted by an angle θ with respect to the layer normal and in SC* bulk material, it rotates,
forming a helical structure with the axis perpendicular to the layers. However, as the LC
thickness is far below the helix pitch, and due to the planar anchoring conditions, the helical
structure is suppressed so LC exhibits ferroelectricity properties. The spontaneous polarization,
S
P
uur
, lies in the smectic layers and is perpendicular to the director. This structure is called SSFLC
(Surface-Stabilized Ferroelectric Liquid Crystal) [6]. Application of an alternative electric field,
E
, to this cell (Fig. 2) makes
S
P
uur
aligns with
E
and the molecules move between two stable
states (up” and down”). The experiments were made with the FLC cell set perpendicular to the
incident light.

4
The parameters issued from experimental MMs (M) were extracted by the Lu and
Chipman decomposition [7], which consists in assuming that the medium under study is
composed successively of a diattenuator, M
D
, a retarder, M
R
, and a depolarizer, M
, so that
R D
M M M M
= . For a FLC cell in normal incidence, no diattenuation is expected, and the values
obtained are only associated to the experimental noise. In that case, the parameters used for the
characterization are the depolarization index, P
D
, the retardance, R, the fast axis-orientation, α
R
,
and -ellipticity, ε
R
[8]. They are linked to the director-orientation and -distribution in the FLC
cell. The orientation of the fast axis, α
R
, is equal to the apparent angle, θ
app
(Fig. 2). It represents
the angle between the projection of the director on the (O
x
,O
y
) plane and the smectic layer
normal (O
y
axis). The retardance, R, is linked to the angle, χ, by the following relationships:
0
2 ( )
n d
R
π χ
λ
=
[ ] [ ]
2 2 2 2
( )
e o
o
e o
n n
n n
n Cos n Sin
χ
χ χ
=
+
(1)
where n
o
is the ordinary index of the FLC, and n
e
is the extraordinary one. As R gives insight into
the director position in the (O
y
,O
z
) plane, the knowledge of θ
app
and χ is sufficient to describe
n
r
in a 3-D system on condition to assume a homogeneous distribution of the latter within the light
beam. The last two parameters characterize the homogeneity of the director distribution. The
ellipticity of the FLC cell-associated retarder appears when the distribution of the director
orientation is non-homogeneous in the O
z
direction (twist). Indeed, if one considers a succession,
in the O
z
direction, of thin layers of thickness, ξ, composed of molecules with an orientation, ψ
i
,
the resulting MM is
( , )
Z R i
M M
ξ ψ
=
, where M
R
is the MM of a linear retarder of thickness,
ξ
,
and fast axis orientation,
ψ
i
. If
ψ
i
is varying across the total thickness, d, M
z
will be an elliptic
retarder. Ellipticity gives thus insight into the homogeneity of the director orientation along the
cell thickness. The depolarization index, P
D
, is equal to 1 for an elliptic retarder. If one now

Citations
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Journal ArticleDOI
TL;DR: A polarimetry based method able to characterize optical properties of linear Liquid Crystal Displays (LCDs), even in presence of time-fluctuations of the phase, is proposed, and mean linear retardance, Liquid Crystal (LC) fast axis orientation and phase fluctuation amplitude of LCDs can be obtained with the proposed alternative technique.
Abstract: A polarimetry based method able to characterize optical properties of linear Liquid Crystal Displays (LCDs), even in presence of time-fluctuations of the phase, is proposed in this work. In particular, mean linear retardance, Liquid Crystal (LC) fast axis orientation and phase fluctuation amplitude of LCDs can be obtained with the proposed alternative technique. This technique enables to achieve these important features of LCDs with a set-up significantly less complicated to build up and with faster measurements than previously proposed techniques, which are based on diffraction or interferometry experiments. The validity of the technique is tested by measuring two different LCDs: one monopixel PA-LC panel working in transmission and a reflective PA-LCoS display. The technique provides similar results than those obtained by using previously proposed methods, confirming the validity of our alternative technique.

33 citations

Journal ArticleDOI
Tingkui Mu1, Chunmin Zhang1, Chenling Jia1, Wenyi Ren1, Lin Zhang1, Qiwei Li1 
TL;DR: In this article, a general compensation procedure is proposed to account for the alignment errors, which also considers the potential misalignment in the two polarized reference beams, and a mathematical basis for selecting optimal channels to reconstruct full Stokes parameters is provided.

25 citations

Journal ArticleDOI
TL;DR: Simulation results show that the alignment errors can be determined accurately and the errors of the reconstructed Stokes parameters due to the aligned errors are reduced effectively by the presented method.
Abstract: This paper presents a method to calibrate alignment errors for a channeled spectropolarimeter. A calibration model, including an alignment errors determination model and an alignment errors compensation model, is derived firstly. To determine the exact alignment errors of the high-order retarders and polarizer included in the spectropolarimeter, an auxiliary high-order retarder and a reference beam are used. The auxiliary high-order retarder does not affect the normal use of the spectropolarimeter and the polarization state of the reference beam needs not to be controlled accurately. Based on the determination results, the alignment errors are compensated by using a correction algorithm without any precise mechanical adjustments. Simulation results show that the alignment errors can be determined accurately and the errors of the reconstructed Stokes parameters due to the alignment errors are reduced effectively by the presented method. Finally, experimental results are summarized and analyzed to demonstrate the effectiveness of the calibration method.

19 citations

Dissertation
18 Oct 2011
TL;DR: In this paper, a new tool and method to accurately characterize overlay by measuring a single target built in the scribe lines is proposed, which uses the fundamental symmetry properties of the Mueller matrix acquired in the back focal plane of a high-aperture microscope objective and enables a characterization of overlay with a total measurement uncertainty of 2nm.
Abstract: With the constant decrease of the size of the transistors in microelectronics, the characterization tools have to be more and more accurate and have to provide higher and higher throughput. Semiconductor manufacturing being a layer-by-layer process, the fine positioning of the stack is crucial. The misalignment of the stack is called overlay and we here propose a new tool and method to accurately characterize overlay by measuring a single target built in the scribe lines. The method uses the fundamental symmetry properties of the Mueller matrix acquired in the back focal plane of a high-aperture microscope objective and enables a characterization of the overlay with a total measurement uncertainty of 2nm. After a brief introduction to polarization and the Mueller matrix, we describe the new design of the instrument and its complete calibration. The main body of this manuscript is dedicated to the overlay characterization but the applications of this instrument are very diverse so we also detail how our instrument can shed some light on the characterization and the understanding of the auto-organization of some scarab beetles' exoskeleton. These beetles exhibit a very strong circular dichroism and many research groups around theworld try to mimic their exoskeleton. We conclude this manuscript with a brief overview of the main perspectives from our instrument.

17 citations


Cites methods from "Time-resolved switching analysis of..."

  • ...38 2.2.2 General considerations on polarimeters . . . . . . . . . . . . . . . 38 2.2.3 Design and optimization of the PSG (PSA) . . . . . . . . . . . . . 42 2.3 Calibration of the system . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 2.3.1 Eigen Value Calibration Method . . . . . . . . . . . . . . . . . . . 45 2.3.2 Discussions on the Eigen Value Calibration Method and experi- mental implementation . . . . . . . . . . . . . . . . . . . . . . . . 49 2.3.3 Objective calibration . . . . . . . . . . . . . . . . . . . . . . . . . ....

    [...]

  • ...This is one of the many designs we could have chosen for the PSG [43, 47, 48, 49, 50, 51]....

    [...]

Journal ArticleDOI
TL;DR: Simulation results show that alignment errors and retardations can be calibrated accurately, and the reconstructed Stokes parameters by using the presented method are more precise than by using a traditional self-correction method.
Abstract: Alignment errors of birefringent retarders and retardation errors introduced by environmental perturbations can cause significant influences on reconstructed Stokes parameters for the channeled spectropolarimeter. In this paper, we propose what we believe is a novel self-correction model that is independent of input polarization parameters to reduce the effects of alignment errors and environmental perturbations. This self-correction method can realize calibration and compensation of alignment errors and retardations simultaneously by measuring the target light in orbit. Simulation results show that alignment errors and retardations can be calibrated accurately, and the reconstructed Stokes parameters by using the presented method are more precise than by using the traditional method. The validity and feasibility of the presented method are further confirmed through experiments in the presence of alignment errors and environmental perturbations.

11 citations

References
More filters
Journal ArticleDOI
TL;DR: Ferroelectric smectic C (FSC) liquid crystals are used in a simple new geometry that allows the spontaneous formation of either of two surface-stabilized smective C monodomains of opposite ferroelectric polarization as discussed by the authors.
Abstract: Ferroelectric smectic C (FSC) liquid crystals are used in a simple new geometry that allows the spontaneous formation of either of two surface‐stabilized smectic C monodomains of opposite ferroelectric polarization. These domains are separated by well‐defined walls which may be manipulated with an applied electric field. The resulting electro‐optic effects exhibit a unique combination of properties: microsecond dynamics, threshold behavior, symmetric bistability, and a large electro‐optic response.

2,312 citations

Journal ArticleDOI
TL;DR: In this paper, the authors decompose a Mueller matrix into a sequence of three matrix factors: a diattenuator, followed by a retarder, then followed by depolarizer.
Abstract: We present an algorithm that decomposes a Mueller matrix into a sequence of three matrix factors: a diattenuator, followed by a retarder, then followed by a depolarizer. Those factors are unique except for singular Mueller matrices. Based on this decomposition, the diattenuation and the retardance of a Mueller matrix can be defined and computed. Thus this algorithm is useful for performing data reduction upon experimentally determined Mueller matrices.

1,220 citations

Journal ArticleDOI
TL;DR: A pair of thick birefringent retarders is incorporated into the spectroscopic polarimeter, so the generated channeled spectrum is composed of three quasi-cosinusoidal components carrying the information about the SOP of the light that is being measured.
Abstract: We describe a novel method for the spectroscopic measurement of the state of polarization (SOP) of light. A pair of thick birefringent retarders is incorporated into the spectroscopic polarimeter, so the generated channeled spectrum is composed of three quasi-cosinusoidal components carrying the information about the SOP of the light that is being measured. Fourier inversion of the channeled spectrum provides significant parameters for determination of the spectrally resolved Stokes parameters of light. No mechanically movable components for polarization control or active devices for polarization modulation are used, and all the Stokes parameters can be determined at once from only the single spectrum. The effectiveness of this method is demonstrated by the generation of elliptically polarized light whose SOP varies with wave number.

397 citations


"Time-resolved switching analysis of..." refers methods in this paper

  • ...The principle of the Snapshot Mueller Matrix Polari meter (SMMP) developed by our team and based on wavelength polarization coding [1 ,2] is that the polarization states are encoded in the spectral domain through use of a bro d and source and high-order retarders [3]....

    [...]

Journal ArticleDOI
TL;DR: In this article, the authors characterized the process that yields high speed, bistable, electro-optic switching in the surface-stabilized ferroelectric liquid crystal geometry, at intermediate electric fields.
Abstract: We have characterized the process that yields high‐speed, bistable, electro‐optic switching in the surface‐stabilized ferroelectric liquid crystal geometry, at intermediate electric fields. Switching proceeds by a continuous reversal of ferroelectric polarization in regions away from the surfaces of the sample, followed by the nucleation and growth of domains of reversed polarization in the remaining surface layers. A model involving bulk distortion+electrostatic+surface free energy successfully accounts for the variation of the switching process with changes in applied electric field.

82 citations

Journal ArticleDOI
TL;DR: A new, to the best of the knowledge, experimental configuration of Mueller matrix polarimeter based on wavelength polarization coding is presented, which is a compact and fast technique to study polarization phenomena.
Abstract: We present a new, to the best of our knowledge, experimental configuration of Mueller matrix polarimeter based on wavelength polarization coding. This is a compact and fast technique to study polarization phenomena. Our theoretical approach, the necessity to correct systematic errors and our experimental results are presented. The feasibility of the technique is tested on vacuum and on a linear polarizer.

75 citations


"Time-resolved switching analysis of..." refers methods in this paper

  • ...The coefficients of a MM ( mij) are retrieved through application of a Fourier tr ansform to I(λ) since they are linked to the magnitudes of the Fou rier peaks through relationships that only depend on the retarder-thicknesses configurati on [1]....

    [...]

  • ...The principle of the Snapshot Mueller Matrix Polari meter (SMMP) developed by our team and based on wavelength polarization coding [1 ,2] is that the polarization states are encoded in the spectral domain through use of a bro d and source and high-order retarders [3]....

    [...]

Frequently Asked Questions (12)
Q1. What contributions have the authors mentioned in the paper "Time-resolved switching analysis of a ferroelectric liquid crystal by snapshot mueller matrix polarimetry" ?

HAL this paper is a multi-disciplinary open access archive for the deposit and dissemination of scientific research documents, whether they are published or not. 

The principle of the Snapshot Mueller Matrix Polarimeter (SMMP) developed by ourteam and based on wavelength polarization coding [1,2] is that the polarization states are encoded in the spectral domain through use of a broadband source and high-order retarders [3]. 

The cell is then filled by capillary suction and the LC is confined between both plates in planar orientation which means that the LC molecules are parallel to the substrate. 

In that case, the parameters used for the characterization are the depolarization index, PD, the retardance, R, the fast axis-orientation, αR, and -ellipticity, εR [8]. 

The director is tilted by an angle θ with respect to the layer normal and in SC* bulk material, it rotates, forming a helical structure with the axis perpendicular to the layers. 

A square voltage between ± 15 V at 30 Hz was applied to the FLC cell to investigate thedynamics of switching between the up and the down states. 

Analysis of εR behavior at the transition is more complex because of the non homogeneity of the director distribution in the (Ox,Oy) plane. 

On-going researches are focused on the development of a more detailed model of the director distribution within the cell to further quantify ellipticity and depolarization. 

The coefficients of a MM (mij) are retrieved through application of a Fourier transform to I(λ) since they are linked to the magnitudes of the Fourier peaks through relationships that only depend on the retarder-thicknesses configuration [1]. 

By application of the calibration procedures described in [2], the accuracy on the mij coefficients (normalized by m00) is below 0.03 for measurements of well-known media (polarizer, wave-plate). 

if one considers a succession, in the Oz direction, of thin layers of thickness, ξ, composed of molecules with an orientation, ψi, the resulting MM is ( , )Z R iM M ξ ψ= ∏ , where MR is the MM of a linear retarder of thickness, ξ,and fast axis orientation, ψi. 

At room temperature (25°C), this LC is in the smectic C* phase, where the molecular layers are perpendicular to the rubbing direction.