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Transport and infrared photoresponse properties of InN nanorods/Si heterojunction.

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TLDR
The faster rise and decay time indicate that the InN NRs/n-Si heterojunction is highly sensitive to IR light.
Abstract
The present work explores the electrical transport and infrared (IR) photoresponse properties of InN nanorods (NRs)/n-Si heterojunction grown by plasma-assisted molecular beam epitaxy. Single-crystalline wurtzite structure of InN NRs is verified by the X-ray diffraction and transmission electron microscopy. Raman measurements show that these wurtzite InN NRs have sharp peaks E 2(high) at 490.2 cm-1 and A 1(LO) at 591 cm-1. The current transport mechanism of the NRs is limited by three types of mechanisms depending on applied bias voltages. The electrical transport properties of the device were studied in the range of 80 to 450 K. The faster rise and decay time indicate that the InN NRs/n-Si heterojunction is highly sensitive to IR light.

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Binary group III-nitride based heterostructures: band offsets and transport properties

TL;DR: In this paper, the growth of non-polar III-nitrides has been an important subject due to its potential improvement on the efficiency of III-nodes-based opto-electronic devices.
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High-Performance p-BP/n-PdSe2 Near-Infrared Photodiodes with a Fast and Gate-Tunable Photoresponse.

TL;DR: A novel van der Waals (vdW) TMDs heterojunction photo-diode composed of black phosphorus (p-BP) and palladium diselenide (n-PdSe2) which establish a high and tunable rectification and photoresponsivity and demonstrates extraordinary values of detectivity and external quantum efficiency.
Journal ArticleDOI

Black Phosphorus-IGZO van der Waals Diode with Low-Resistivity Metal Contacts.

TL;DR: A van der Waals heterojunction composed of p-type black phosphorus (p-BP) and n-type indium-gallium-zinc oxide (n-IGZO) films with low-resistivity metal contacts is reported, and it demonstrates high rectification.
Journal ArticleDOI

Single n + -i-n + InP nanowires for highly sensitive terahertz detection

TL;DR: The axial doping profile of the n+-i-n+ InP nanowires has been calibrated and characterized using combined optical and electrical approaches to achieve nanowire devices with low contact resistances, on which the highly-sensitive InP single-nanowire photoconductive THz detectors have been demonstrated.
References
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Journal ArticleDOI

Unusual properties of the fundamental band gap of InN

TL;DR: The optical properties of wurtzite-structured InN grown on sapphire substrates by molecular-beam epitaxy have been characterized by optical absorption, photoluminescence, and photomodulated reflectance techniques as discussed by the authors.
Journal ArticleDOI

When group-III nitrides go infrared: New properties and perspectives

TL;DR: In this paper, the bandgap of InN was revised from 1.9 eV to a much narrower value of 0.64 eV, which is the smallest bandgap known to date.
Journal ArticleDOI

Indium nitride (InN): A review on growth, characterization, and properties

TL;DR: In this paper, the authors reviewed the development of indium nitride (InN) semiconductors from its evolution to the present day and discussed the most popular growth techniques, metalorganic vapor phase epitaxy and molecular beam epitaxy.
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ZnO nanobelt/nanowire Schottky diodes formed by dielectrophoresis alignment across au electrodes.

TL;DR: Rectifying diodes of single nanobelt/nanowire-based devices have been fabricated by aligning single ZnO nanobelts/ nanowires across paired Au electrodes using dielectrophoresis to form the Schottky diode.
Journal ArticleDOI

Ensemble Monte Carlo study of electron transport in wurtzite InN

TL;DR: In this paper, the first five conduction bands derived from the pseudopotential method and a numerically calculated impact ionization transition rate using a wave-vector-dependent dielectric function were studied using an ensemble Monte Carlo method.
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