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Journal ArticleDOI

Tunable and stable in time ferroelectric imprint through polarization coupling

23 Jun 2016-APL Materials (AIP Publishing)-Vol. 4, Iss: 6, pp 066103
TL;DR: In this article, a method to tune a ferroelectric imprint, which is stable in time, based on the coupling between the non-switchable polarization of ZnO and switchable polarities of PbZrxTi(1−x)O3, was demonstrated.
Abstract: Here we demonstrate a method to tune a ferroelectric imprint, which is stable in time, based on the coupling between the non-switchable polarization of ZnO and switchable polarization of PbZrxTi(1−x)O3. SrRuO3/PbZrxTi(1−x)O3/ZnO/SrRuO3 heterostructures were grown with different ZnO thicknesses. It is shown that the coercive voltages and ferroelectric imprint vary linearly with the thickness of ZnO. It is also demonstrated that the ferroelectric imprint remains stable with electric field cycling and electric field stress assisted aging

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Citations
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Journal ArticleDOI
03 Jun 2020-ACS Nano
TL;DR: It is demonstrated that Tin monosulfide films less than 6 nm thick shows optimum performance as semiconductor channel in in-plane ferro electric analogue synaptic device, whereas thicker films have much poorer ferroelectric response due to screening effects by a higher concentration of charge carriers.
Abstract: Two-dimensional ferroelectrics is attractive for synaptic device applications because of its low power consumption and amenability to high-density device integration. Here, we demonstrate that tin monosulfide (SnS) films less than 6 nm thick show optimum performance as a semiconductor channel in an in-plane ferroelectric analogue synaptic device, whereas thicker films have a much poorer ferroelectric response due to screening effects by a higher concentration of charge carriers. The SnS ferroelectric device exhibits synaptic behaviors with highly stable room-temperature operation, high linearity in potentiation/depression, long retention, and low cycle-to-cycle/device-to-device variations. The simulated device based on ferroelectric SnS achieves ∼92.1% pattern recognition accuracy in an artificial neural network simulation. By switching the ferroelectric domains partially, multilevel conductance states and the conductance ratio can be obtained, achieving high pattern recognition accuracy.

79 citations

Journal ArticleDOI
TL;DR: In this article, the role of point defects in ferroelectric-polarization switching was investigated and the authors provided systematic experimental evidence that point defects can be used to deterministically create and spatially locate point defects, resulting in small and symmetric changes in the coercive field.
Abstract: Electric-field switching of polarization is the building block of a wide variety of ferroelectric devices. In turn, understanding the factors affecting ferroelectric switching and developing routes to control it are of great technological significance. This work provides systematic experimental evidence of the role of defects in affecting ferroelectric-polarization switching and utilizes the ability to deterministically create and spatially locate point defects in $\mathrm{PbZ}{\mathrm{r}}_{0.2}\mathrm{T}{\mathrm{i}}_{0.8}{\mathrm{O}}_{3}$ thin films via focused-helium-ion bombardment and the subsequent defect-polarization coupling as a knob for on-demand control of ferroelectric switching (e.g., coercivity and imprint). At intermediate ion doses ($0.22--2.2\ifmmode\times\else\texttimes\fi{}{10}^{14}\phantom{\rule{0.16em}{0ex}}\mathrm{ions}\phantom{\rule{0.16em}{0ex}}{\mathrm{cm}}^{\ensuremath{-}2}$), the dominant defects (isolated point defects and small clusters) show a weak interaction with domain walls (pinning potentials from $200--500\phantom{\rule{0.16em}{0ex}}\mathrm{K}\phantom{\rule{0.16em}{0ex}}\mathrm{MV}\phantom{\rule{0.16em}{0ex}}{\mathrm{cm}}^{\ensuremath{-}1}$), resulting in small and symmetric changes in the coercive field. At high doses ($0.22--1\ifmmode\times\else\texttimes\fi{}{10}^{15}\phantom{\rule{0.16em}{0ex}}\mathrm{ions}\phantom{\rule{0.16em}{0ex}}{\mathrm{cm}}^{\ensuremath{-}2}$), on the other hand, the dominant defects (larger defect complexes and clusters) strongly pin domain-wall motion (pinning potentials from 500 to $1600\phantom{\rule{0.16em}{0ex}}\mathrm{K}\phantom{\rule{0.16em}{0ex}}\mathrm{MV}\phantom{\rule{0.16em}{0ex}}{\mathrm{cm}}^{\ensuremath{-}1}$), resulting in a large increase in the coercivity and imprint, and a reduction in the polarization. This local control of ferroelectric switching provides a route to produce novel functions; namely, tunable multiple polarization states, rewritable pre-determined 180\ifmmode^\circ\else\textdegree\fi{} domain patterns, and multiple zero-field piezoresponse and permittivity states. Such an approach opens up pathways to achieve multilevel data storage and logic, nonvolatile self-sensing shape-memory devices, and nonvolatile ferroelectric field-effect transistors.

37 citations

Journal ArticleDOI
TL;DR: In this article, it is shown that by locally controlling the nucleation energy distribution at the ferroelectric-electrode interface multiple-addressable states in a ferroelectric can be created, which is necessary for adaptive/synaptic applications.
Abstract: Traditionally thermodynamically bistable ferroic materials are used for nonvolatile operations based on logic gates (e.g., in the form of field effect transistors). But, this inherent bistability in these class of materials limits their applicability for adaptive operations. Emulating biological synapses in real materials necessitates gradual tuning of resistance in a nonvolatile manner. Even though in recent years few observations have been made of adaptive devices using a ferroelectric, the principal question as to how to make a ferroelectric adaptive has remained elusive in the literature. Here, it is shown that by locally controlling the nucleation energy distribution at the ferroelectric–electrode interface multiple-addressable states in a ferroelectric can be created, which is necessary for adaptive/synaptic applications. This is realized by depositing a layer of nonswitchable ZnO on top of thin film ferroelectric PbZr x Ti(1– x )O3. This methodology of interface-engineered ferroelectric should enable realising brain-like adaptive/synaptic memory in complementary metal-oxide-semiconductor (CMOS) devices. Furthermore, the temporally stable multistability in ferroelectrics should enable the designing of multistate memory and logic devices

19 citations

Journal ArticleDOI
TL;DR: A bridge is built between the hysteretic behavior observed either in the C- E and current-electric field characteristics on a MFS structure and the current characteristics of the BCZT/ZnO bilayers in a metal-ferroelectric-semiconductor (MFS) configuration.
Abstract: In the present work, we study the hysteretic behavior in the electric-field-dependent capacitance and the current characteristics of 0.5Ba(Zr0.2Ti0.8)O3–0.5(Ba0.7Ca0.3)TiO3 (BCZT)/ZnO bilayers depo...

15 citations

Journal ArticleDOI
TL;DR: In this article, the effect of electric field on polarization switching kinetics has been investigated and has been analyzed by the nucleation limited switching model with a Lorentzian distribution function.
Abstract: In this work, the ferroelectric characteristics of 0.5Ba(Zr0.2Ti0.8)O3-0.5(Ba0.7Ca0.3)TiO3 (BCZT) thin films grown on 0.7 wt. % Nb-doped (001)-SrTiO3 (Nb:STO) single-crystal have been investigated. High-resolution transmission electron microscopy and electron energy loss spectroscopy revealed a very sharp Nb:STO/BCZT interface, while selected area electron diffraction revealed the epitaxial growth of the BCZT layer on the Nb:STO substrate. The ferroelectric nature of the BCZT films have been investigated by piezoresponse force microscopy and hysteresis loops. The effect of electric field on polarization switching kinetics has been investigated and has been analyzed by the nucleation limited switching model with a Lorentzian distribution function. The local field variation was found to decrease with the increase in the electric field, and thus, the switching process becomes faster. The peak value of the polarization current and the logarithmic characteristic switching time exhibited an exponential dependence on the inverse of electric field. This model gave an excellent agreement with the experimental polarization reversal transients throughout the whole time range.

12 citations

References
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Journal ArticleDOI
TL;DR: In this paper, the authors reviewed the existing theoretical models describing the interface-induced phenomena which affect the switching characteristics and dielectric properties of ferroelectric thin-film capacitors.
Abstract: This article reviews the existing theoretical models describing the interface-induced phenomena which affect the switching characteristics and dielectric properties of ferroelectric thin films. Three groups of interface-induced effects are addressed—namely, “passive-layer-type” effects, ferroelectric-electrode contact potential effects, and the poling effect of the ferroelectric-electrode interface. The existing experimental data on dielectric and switching characteristics of ferroelectric thin film capacitors are discussed in the context of the reviewed theories. Special attention is paid to the case of internal bias field effects.

390 citations

Journal ArticleDOI
01 Jan 1952

367 citations

Journal ArticleDOI
18 Nov 2011-Science
TL;DR: In this paper, the authors synthesized high-quality PMN-PT epitaxial thin films on vicinal (001) Si wafers with the use of a template layer with superior piezoelectric coefficients (e31,f = −27 ± 3 coulombs per square meter).
Abstract: Microelectromechanical systems (MEMS) incorporating active piezoelectric layers offer integrated actuation, sensing, and transduction. The broad implementation of such active MEMS has long been constrained by the inability to integrate materials with giant piezoelectric response, such as Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT). We synthesized high-quality PMN-PT epitaxial thin films on vicinal (001) Si wafers with the use of an epitaxial (001) SrTiO3 template layer with superior piezoelectric coefficients (e31,f = –27 ± 3 coulombs per square meter) and figures of merit for piezoelectric energy-harvesting systems. We have incorporated these heterostructures into microcantilevers that are actuated with extremely low drive voltage due to thin-film piezoelectric properties that rival bulk PMN-PT single crystals. These epitaxial heterostructures exhibit very large electromechanical coupling for ultrasound medical imaging, microfluidic control, mechanical sensing, and energy harvesting.

366 citations

Journal Article
TL;DR: These epitaxial heterostructures exhibit very large electromechanical coupling for ultrasound medical imaging, microfluidic control, mechanical sensing, and energy harvesting and incorporated into microcantilevers that are actuated with extremely low drive voltage due to thin-film piezoelectric properties that rival bulk PMN-PT single crystals.
Abstract: High-quality piezoelectric thin films are grown and exhibit superior properties for microelectromechanical systems. Microelectromechanical systems (MEMS) incorporating active piezoelectric layers offer integrated actuation, sensing, and transduction. The broad implementation of such active MEMS has long been constrained by the inability to integrate materials with giant piezoelectric response, such as Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT). We synthesized high-quality PMN-PT epitaxial thin films on vicinal (001) Si wafers with the use of an epitaxial (001) SrTiO3 template layer with superior piezoelectric coefficients (e31,f = –27 ± 3 coulombs per square meter) and figures of merit for piezoelectric energy-harvesting systems. We have incorporated these heterostructures into microcantilevers that are actuated with extremely low drive voltage due to thin-film piezoelectric properties that rival bulk PMN-PT single crystals. These epitaxial heterostructures exhibit very large electromechanical coupling for ultrasound medical imaging, microfluidic control, mechanical sensing, and energy harvesting.

345 citations

Journal ArticleDOI
TL;DR: The fabrication and characterization of two promising capacitor-less memory architectures that marry the ferroelectric polarization directly to the channel of a field effect transistor is reported on.
Abstract: The non-volatile polarization of a ferroelectric is a promising candidate for digital memory applications. Ferroelectric capacitors have been successfully integrated with silicon electronics, where the polarization state is read out by a device based on a field effect transistor configuration. Coupling the ferroelectric polarization directly to the channel of a field effect transistor is a long-standing research topic that has been difficult to realize due to the properties of the ferroelectric and the nature of the interface between the ferroelectric and the conducting channel. Here, we report on the fabrication and characterization of two promising capacitor-less memory architectures.

240 citations