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Journal ArticleDOI

Two Microscopes, One Software

01 Nov 2006-Imaging & Microscopy (WILEY‐VCH Verlag)-Vol. 8, Iss: 4, pp 43-44
TL;DR: In this paper, atomic force microscopy (AFM) and optical microscopy, in particular fluorescence microscopy are combined in order to detect specific structures in a heterogeneous sample, such as a cell.
Abstract: Atomic force microscopy (AFM) and optical microscopy, in particular fluorescence microscopy, make a powerful combination in the study of biological samples. AFM is not subject to Abbe's resolution limit, and can generate images with a much higher resolution than light microscopy. However, as contrast is generated in response to the structural properties of the sample, it can be challenging to detect specific structures in a heterogeneous sample, such as a cell. By combining the two techniques, higher resolution structural information can be generated using AFM. Subsequent correlation with fluorescently labelled markers can provide information about the composition, and consequently the function, of the identified structures.
Citations
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Book ChapterDOI
01 Jan 2007
TL;DR: This chapter gives an overview of the instrumentation and most common imaging modes used in AFM nowadays, as well as different preparation protocols for single molecule and cell applications, and features some recent developments in state-of-the-art AFMs as tools to study molecular and cellular dynamics with high spatial and temporal resolution.
Abstract: The last decade have established AFM as a technique in life sciences applications ranging from single molecules to living cells and tissues. AFM still remains one of the few microscopy tools to offer premium resolution on bio-macromolecules at near physiological/native sample conditions. The demand for correlative immunochemical and ultrastructural characterization of macromolecular complexes and cells has made the combination of AFM and advanced optical microscopy techniques almost ubiquitous in every life sciences lab. This chapter gives an overview of the instrumentation and most common imaging modes used in AFM nowadays, as well as different preparation protocols for single molecule and cell applications. We finish with application examples that feature some recent developments in state-of-the-art AFMs as tools to study molecular and cellular dynamics with high spatial and temporal resolution.

9 citations

Patent
21 Dec 2006
TL;DR: In this article, a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to examine a measurement sample using a scanner and optically examining said sample is described.
Abstract: The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the method, an optical image of a measurement section of a measurement sample to be examined, said image being recorded with the aid of an optical recording device, is displayed on a display apparatus, a choice of a position in the optical image is detected, and, for a scanning probe measurement, a measurement probe which is configured for the scanning probe measurement is moved, using a movement apparatus which moves the measurement probe and the measurement sample relative to one another, to a measurement position, which is assigned to the selected position in the optical image in accordance with coordinate transformation, by virtue of the movement apparatus being controlled in accordance with the coordinate transformation, wherein a previously determined assignment between a coordinate system of the optical image and a coordinate system of a space covered by movement positions of the measurement probe and the measurement sample is formed with the coordinate transformation, wherein the movement positions comprise the measurement position.

6 citations

Patent
21 Dec 2006
TL;DR: In this article, a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to examine a measurement sample using a scanner and optically examining said sample is described.
Abstract: The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the method, an optical image of a measurement section of a measurement sample to be examined, said image being recorded with the aid of an optical recording device, is displayed on a display apparatus, a choice of a position in the optical image is detected, and, for a scanning probe measurement, a measurement probe which is configured for the scanning probe measurement is moved, using a movement apparatus which moves the measurement probe and the measurement sample relative to one another, to a measurement position, which is assigned to the selected position in the optical image in accordance with coordinate transformation, by virtue of the movement apparatus being controlled in accordance with the coordinate transformation, wherein a previously determined assignment between a coordinate system of the optical image and a coordinate system of a space covered by movement positions of the measurement probe and the measurement sample is formed with the coordinate transformation, wherein the movement positions comprise the measurement position.

4 citations