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Proceedings ArticleDOI

Using low-k oxide for reduction of leakage current in Double Gate Tunnel FET

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TLDR
In this article, the double gate tunneling field effect transistors (DG-TFETs) were investigated to enhance I on /I off ratio in the Double Gate Tunneling Field Effect Transistor.
Abstract
In order to enhance I on /I off ratio in the Double Gate Tunneling Field Effect Transistor (DG-TFET), employing a double gate structure has been investigated. Furthermore by employing a low-k oxide for the gate near the drain side (Gate2) fringing field effects are suppressed. Hence, the leakage current is decreased. Also a work function engineering method has been employed for the gate near the source (Gate1) to further reduce the off state current.

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Citations
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Proceedings Article

Scaling properties of the tunneling field effect transistor (TFET) : Device and circuit

TL;DR: In this paper, the scaling properties of TFETs were investigated using standard 130 nm, 90 nm, and 65 nm CMOS process flows. But the TFET dependence on the design parameters, i.e. channel width and length, is comparable to that of the standard MOSFET.
Patent

Tunnel field effect transistor with improved subthreshold swing

TL;DR: In this paper, the authors presented a tunnel field effect transistor (TFET) device comprising at least following segments: a highly doped drain region (3), a lowly doped up to undoped channel region (2) being in contact with said drain region, the channel region having a longitudinal direction, and the contact between the source region and the channel regions forming a source-channel interface (12), a gate dielectric (10) and a gate electrode (9) covering along the longitudinal direction at least part of the source and channel regions, said gate electrode(9
Journal ArticleDOI

Temperature effect on hetero structure junctionless tunnel FET

TL;DR: In this paper, the authors investigated the temperature effect on AlGaAs/Si based hetero-structure junctionless double gate tunnel field effect transistor (JT-FET).

Simulation of Double-Gate Silicon Tunnel FETs with a High-k Gate Dielectric

TL;DR: In this paper, a non-local band-to-band tunneling model is used to evaluate the performance of tunnel FETs, and the scaling limits of the threshold voltage at gate lengths on the order of 10-20 nm.
Journal ArticleDOI

Improving gate delay and I ON / I OFF in nanoscale heterostructure field effect diode (H-FED) by using heavy doped layers in the channel

TL;DR: In this paper, the effects of biaxial tensile strain on the electrical characteristics of the field effect diode (FED) in the nanometer regime were explored and a new structure, namely heterostructure FED (H-FED), was proposed, which does not turn off for channel lengths shorter than 75nm.
References
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Journal ArticleDOI

Double-Gate Tunnel FET With High- $\kappa$ Gate Dielectric

TL;DR: In this article, a double-gate tunnel field effect transistor (DG tunnel FET) with a high-kappa gate dielectric was proposed and validated using realistic design parameters, showing an on-current as high as 0.23 mA for a gate voltage of 1.8 V, an off-current of less than 1 fA (neglecting gate leakage), an improved average sub-threshold swing of 57 mV/dec, and a minimum point slope of 11 mV /dec.
Journal ArticleDOI

Complementary tunneling transistor for low power application

TL;DR: In this paper, the complementary Si-based tunneling transistors are investigated in detail, and it is found that the band-to-band tunneling current is controlled by the gate-tosource voltage.
Journal ArticleDOI

Impact of the dimensionality on the performance of tunneling FETs: Bulk versus one-dimensional devices

TL;DR: In this article, the influence of dimensionality on the performance of tunneling field effect transistors is investigated with simulations and it is shown that in contrast to the 3D case, one-dimensional systems offer the possibility to combine a high on-state performance with steep inverse sub-threshold slopes.
Journal ArticleDOI

Vertical tunnel field-effect transistor

TL;DR: In this paper, a vertical field effect transistor (FET) with a vertical gate controlling the band-to-band tunneling width is presented, and the operation of the device is shown by means of both experimental results as well as two-dimensional computer simulations.
Journal ArticleDOI

A simulation approach to optimize the electrical parameters of a vertical tunnel FET

TL;DR: In this article, the electrical parameters of gated tunnel field effect transistor (FET) were optimized with a SiGe delta doped layer in the source region, which leads to an asymmetry in the n-and p-channel performance.
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