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VLSI Test Principles and Architectures: Design for Testability
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TLDR
A comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time to market and time-to-volume as mentioned in this paper.Abstract:
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
Table of Contents
Chapter 1 - Introduction
Chapter 2 - Design for Testability
Chapter 3 - Logic and Fault Simulation
Chapter 4 - Test Generation
Chapter 5 - Logic Built-In Self-Test
Chapter 6 - Test Compression
Chapter 7 - Logic Diagnosis
Chapter 8 - Memory Testing and Built-In Self-Test
Chapter 9 - Memory Diagnosis and Built-In Self-Repair
Chapter 10 - Boundary Scan and Core-Based Testing
Chapter 11 - Analog and Mixed-Signal Testing
Chapter 12 - Test Technology Trends in the Nanometer Ageread more
Citations
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Proceedings ArticleDOI
Survey of low power testing of VLSI circuits
P. Basker,A. Arulmurugan +1 more
TL;DR: Low power dissipation during test application is becoming increasingly important in today's V LSI systems design and is a major goal in the future development of VLSI design.
Book
Electronic Design Automation: Synthesis, Verification, and Test
TL;DR: EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits.
Journal ArticleDOI
Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug
Ho Fai Ko,Nicola Nicolici +1 more
TL;DR: This paper presents accelerated algorithms for restoring circuit state elements from the traces collected during a debug session, by exploiting bitwise parallelism and introduces new metrics that guide the automated selection of trace signals, which can enhance the real-time observability during in-system debug.
Proceedings Article
BIST-based test and diagnosis of FPGA logic blocks : Reconfigurable and Adaptive VLSI Systems
TL;DR: This work introduces the first diagnosis method for multiple faulty PLBs; for any faulty PLB, it is introduced its internal faulty modules or modes of operation and provides the basis for both failure analysis used for yield improvement and for any repair strategy used for fault-tolerance in reconfigurable systems.
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Lean Architecture: for Agile Software Development
James O. Coplien,Gertrud Bjrnvig +1 more
TL;DR: This book helps you to find your own path Taking cues from Lean development, the authors can help steer your project toward practices with longstanding track records.
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Digital Systems Testing and Testable Design
TL;DR: The new edition of Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems offers comprehensive and state-ofthe-art treatment of both testing and testable design.