Journal ArticleDOI
White light interferometry for surface profiling with a colour CCD
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TLDR
In this article, a white light interferometer with a colour CCD camera is discussed, where interference intensity information from the three channels of the color CCD simulating three-wavelength measurement is accessed.About:
This article is published in Optics and Lasers in Engineering.The article was published on 2012-08-01. It has received 53 citations till now. The article focuses on the topics: White light interferometry & Interferometry.read more
Citations
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Journal ArticleDOI
A review of interferometry for geometric measurement
Shuming Yang,Guofeng Zhang +1 more
Journal ArticleDOI
Quantitative phase imaging of human red blood cells using phase-shifting white light interference microscopy with colour fringe analysis
TL;DR: In this paper, phase-shifted interference microscopy was used to image human red blood cells (RBCs) using a color charge coupled device camera and phase maps for red, green, and blue colours were reconstructed.
Journal ArticleDOI
Microsphere-aided Optical Microscopy and its Applications for Super-Resolution Imaging
TL;DR: In this article, the photonic nanojet generated by a dielectric microsphere was used to break the diffraction limit of a standard optical microscope (SOM) in visible spectrum.
Journal ArticleDOI
A novel surface recovery algorithm in white light interferometry
TL;DR: A new recovery algorithm is presented, in which correlation analysis of WLI envelop curves and a multi reference position based phase solution method are employed for robust and high precision surface recovery.
Journal ArticleDOI
Measurement of large discontinuities using single white light interferogram.
Paul Kumar Upputuri,Li Gong,Haifeng Wang,Manojit Pramanik,Krishna Mohan Nandigana,Mahendra P. Kothiyal +5 more
TL;DR: Hilbert transformation analysis of a single white light interferogram acquired with a single-chip color CCD camera for step height measurement which lies beyond the unambiguous range of the monochromatic interferometry is discussed.
References
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Book ChapterDOI
V Phase-Measurement Interferometry Techniques
TL;DR: The phase modulation in an interferometer can be induced by moving a mirror, tilting a glass plate, moving a grating, rotating a half-wave plate or analyzer, using an acoustooptic or electro-optic modulator, or using a Zeeman laser as mentioned in this paper.
Journal ArticleDOI
Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain
Peter J. de Groot,Leslie L. Deck +1 more
TL;DR: In this article, a scanning white-light interferometer for high-precision surface structure analysis is described, where the interferogram for each of the image points in the field of view is generated simultaneously by scanning the object in a direction perpendicular to the object surface, while recording detector data in digital memory.
Journal ArticleDOI
Multiple-wavelength phase-shifting interferometry
Yeou-Yen Cheng,James C. Wyant +1 more
TL;DR: By introducing the phase data of a third wavelength, one can measure the phase of a very steep wave front and the repeatability of the measurement is better than 25-A rms (λ = 6328 A).
Journal ArticleDOI
Step height measurement using two-wavelength phase-shifting interferometry.
TL;DR: Two-wavelength phase-shifting interferometry is applied to an interference phase-measuring microscope enabling the measurement of step features and a measurement dynamic range of 10(4) is obtainable.