WZ-GaN based Quasi-Read ATT diode: A novel high-power THz device with reduced parasitic resistance
01 Dec 2010-pp 1-4
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TL;DR: In this paper, the electrical series resistance of an IMPATT diode was measured based on the oscillation threshold bias current of the diode in a standard circuit and applied to GaAs diodes near 40 GHz.
Abstract: A new method is given for determining the electrical series resistance of an IMPATT diode. The measurement is based on observation of the oscillation threshold bias current for a diode in a standard circuit. The method is applied to GaAs diodes near 40 GHz. The values obtained are used to quantitatively explain other performance characteristics of the diodes.
53 citations
"WZ-GaN based Quasi-Read ATT diode: ..." refers background or methods in this paper
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TL;DR: In this article, the performance of the terahertz-frequency (1.0 THz) characteristics of widebandgap (WBG) wurtzite (Wz)-GaN-and 4H-SiC-based p++nn++-type single-drift-region (SDR) impact avalanche transit time (IMPATT) devices (normal and photoilluminated) is compared through a simulation scheme.
Abstract: Reliability of terahertz-frequency (~1.0 THz) characteristics of wide-bandgap (WBG) wurtzite (Wz)-GaN- and 4H-SiC-based p++nn++-type single-drift-region (SDR) impact avalanche transit time (IMPATT) devices (normal and photoilluminated) is compared through a simulation scheme. The simulation experiment reveals that an RF power density of 3.37 times 1011 W middotm-2 (efficiency of 18.2%) at around 1.126 THz may be realized from the optimized unilluminated GaN IMPATT device, whereas the unilluminated 4H-SiC IMPATT device is expected to generate an RF power density of 1.35 times 1011 W middotm-2 (efficiency of 9%) at 1.05 THz. However, the parasitic series resistance reduces the maximum exploitable power density from the terahertz devices. Under optical illumination, additional photogenerated carriers are created in the devices, and these carriers change the admittance and negative resistance properties of the terahertz IMPATT diodes. The performance modulation of the terahertz devices is simulated, and the results are compared in this paper. Under external radiation, the operating frequencies of the GaN- and SiC-based diodes are found to shift upward by 6.0 and 40.0 GHz, respectively, with degradation of maximum output-power density level and device negative resistance. The extensive simulation experiments establish that, although the photosensitivity of the 4H-SiC-based IMPATT device is better than its GaN counterpart, the overall terahertz performance of the unilluminated GaN IMPATT device is far better than the 4H-SiC-based device, particularly in terms of output power and efficiency. The simulation results and the proposed experimental methodology presented here can be used for realizing optically tuned WBG IMPATT oscillators for terahertz communication.
51 citations
"WZ-GaN based Quasi-Read ATT diode: ..." refers background or methods in this paper
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