How can I learn XPS data?
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XPS can therefore be considered a useful tool in evaluating mantle oxidation state. | |
15 Citations | The bulk XPS data for GaSb, reported here, remain the first reference ones obtained with the use of this preparation method. |
29 Citations | The above XPS information can serve as a supplement to TEM analysis. |
12 Citations | An analysis of network topologies proved useful in explaining the XPS data. |
The obtained data are in a good agreement with XPS analysis. | |
22 Citations | Agreement with empirical XPS data is excellent. |
18 Citations | A comparison of angle-resolved XPS data from different samples thus requires careful and consistent choices for algorithm parameters. |
37 Citations | This has been well supported by the XPS data. |
24 Citations | The reported XPS data represent useful be... |
Related Questions
What are some common techniques or approaches used to present and interpret XPS data in journal papers?5 answersCommon techniques and approaches used to present and interpret XPS data in journal papers include peak fitting based on minimizing a figure-of-merit like residual standard deviation, which requires constraints to prevent incorrect results. Uniqueness plots are suggested for identifying correlation between fit parameters in XPS data analysis, as they are easily interpreted and can help avoid inappropriate peak fits. Understanding the impacts of crystallinity on XPS signals, unexpected spectral line shapes, and the ability of XPS to provide information about built-in potentials and band offsets are crucial for in-depth analysis of epitaxial films and heterostructures. Additionally, mechanisms underlying features in XPS spectra, such as multiplet splittings and shake excitation, are essential for relating XPS features to material properties and electronic structure.
How accurate is XPS?5 answersXPS measurements have achieved high accuracy and reproducibility, with peak energy calibration values having a traceable accuracy of 0.02 eV or better. Interlaboratory tests have shown that commercial instruments can reproduce peak energies to within ±0.035 eV. Relativistic corrections in selected area XPS instruments have been verified to ±0.05 eV. Instrument intensity-energy response functions can be defined between commercial instruments to within about 4%. XPS analyses have become more detailed as samples have become smaller, thinner, and more heterogeneous. XPS peak fitting is best performed when all available information about a sample is used, including its expected chemical and physical composition.
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