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Open access•Proceedings Article•DOI XP Customer Practices: A Grounded Theory Angela Martin, Robert Biddle, James Noble - Show less +2 more 24 Aug 2009 42 Citations	While XP calls for Real Customer Involvement, it does not explain what XP Customers should do, nor how they should do it.
Journal Article•DOI An XPS investigation of alumina thin films utilized in inelastic electron tunneling spectroscopy H.E. Evans, W.M. Bowser, W. H. Weinberg - Show less +2 more 01 Jul 1980-Applications of Surface Science 30 Citations	XPS data might profitably provide such a means of comparison, although sufficiently reliable XPS data for commercial samples are not currently available.
Open access•Journal Article•DOI XUV Photometer System (XPS): Improved Solar Irradiance Algorithm Using CHIANTI Spectral Models Thomas N. Woods, Phillip C. Chamberlin, W. K. Peterson, R. R. Meier, P. G. Richards, D. J. Strickland, Gang Lu, Liying Qian, Stanley C. Solomon, B. A. Iijima, A. J. Mannucci, B. T. Tsurutani - Show less +11 more 30 May 2008-Solar Physics 84 Citations	The new XPS results are consistent with daily variations from the previous simple conversion technique used for XPS and are also consistent with spectral measurements made at wavelengths longer than 27 nm.
Journal Article•DOI Mass spectrometry studies of resist trimming processes in HBr∕O2 and Cl2∕O2 chemistries E. Pargon, Olivier Joubert, T. Chevolleau, Gilles Cunge, Songlin Xu, Thorsten Lill - Show less +5 more 05 Jan 2005-Journal of Vacuum Science & Technology B 26 Citations	The present article confirms the preliminary results obtained by XPS.
Open access•Journal Article•DOI Multi-viewer tracking integral imaging system and its viewing zone analysis Gilbae Park, Jae-Hyun Jung, Keehoon Hong, Yunhee Kim, Younghoon Kim, Sung-Wook Min, Byoungho Lee - Show less +6 more 28 Sep 2009-Optics Express 50 Citations	We propose a multi-viewer tracking integral imaging system for viewing angle and viewing zone improvement.
Journal Article•DOI Silicon damage and residue overlayer caused by rie and ribe processes with CHF3 Ch. Cardinaud, Guy Turban, B. Grolleau, J.P. Grandchamp, C. Lejeune, P. Scheiblin, E. Collard - Show less +6 more 01 Jan 1989-Applied Surface Science 16 Citations	The results suggest a schematic diagram representing the region probed by XPS.
Open access•Journal Article•DOI Influence of elastic scattering of photoelectrons on angle-resolved x-ray photoelectron spectroscopy Kenji Kimura, Kaoru Nakajima, Thierry Conard, Wilfried Vandervorst - Show less +3 more 06 Sep 2007-Applied Physics Letters 17 Citations	The calculated result reproduces the observed XPS result fairly well even at larger emission angles up to 80°, indicating that the accuracy of XPS depth profiling can be improved using the NIST database.

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