How do you calculate lattice mismatch in thin film?
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21 Citations | This analysis based on a method which simulates the interlayer interactions in lattice-mismatched thin films shows that thin films with four or more layers can have stable lattice-matched stacking geometries. |
54 Citations | The mismatch may indicate that in very thin films the lattice distortion and strain field can be relaxed. |
31 Citations | A large lattice mismatch value of 5.7% (to be compared to the normal value of 4.13%) is observed from selected area electron diffraction patterns and high-resolution TEM images of cross-sectional specimens, which suggests that the growing high-temperature film under the film growth condition may have a larger lattice constant and a different thermal expansion behavior with respect to the bulk material. |
530 Citations | In large lattice mismatch systems, we show that epitaxial growth of thin films is possible by matching of domains where integral multiples of major lattice planes match across the interface. |
92 Citations | Since the lattice mismatch strain varies with temperature, it was finally confirmed that the critical dislocation density that leads to the measured residual stress variation with film thickness should be determined from the lattice mismatch strain at the deposition temperature. |
22 Citations | The results presented here indicate that the lattice mismatch between the film and the substrate is accommodated mainly by interface misfit dislocations above some critical thickness. |
| Importantly, our results show that the lattice mismatch is the dominant factor determining the accuracy of layered approximants. | |
20 Citations | Thus, the results presented here indicate that the lattice mismatch between the film and the substrate is accommodated mainly by interface misfit dislocations above some critical thickness. |
4 Citations | This leads to the conclusion that the mitigation of lattice mismatch, essentially through interface misfit dislocations, could have varied with the change of the film thickness. |
11 Citations | These measurements indicate that the lattice mismatch between the metallic overlayer and substrate is relieved by the formation of domains randomly rotated in the plane of the film. |
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