How do you read XPS spectra?
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| Papers (10) | Insight |
|---|---|
17 Citations | Moreover our method gives an easy procedure to obtain the true primary excitation spectra for XPS and AES. |
69 Citations | This behaviour is shown to provide an additional basis for interpretation of XPS spectra |
24 Citations | We observe that characteristic energy loss features of the XPS spectra are not only due to photoelectron energy losses. |
5 Citations | This indicates that in CO/Ni the charge transfer screening mechanism is likely to provide a better description of the XPS spectra, as has already been emphasized earlier. |
79 Citations | Nevertheless, our first-principles calculations of the XPS spectra are in excellent agreement with recent measurements, and we discuss why this is so. |
| Our results suggest several new assignments for the XPS spectra. | |
| The present results suggest several new assignments for the XPS spectra. | |
31 Citations | Our results provide a foundation that makes it possible to establish quantitative relationships between features of the XPS spectra and materials properties. |
| The calculated spectra are in good agreement with those of XPS and O K$\ensuremath{\alpha}$ XES experiments. | |
11 Citations | These results are in agreement with Eu 3d spectra of XPS analysis results. |
Related Questions
How accurate is XPS?5 answersXPS measurements have achieved high accuracy and reproducibility, with peak energy calibration values having a traceable accuracy of 0.02 eV or better. Interlaboratory tests have shown that commercial instruments can reproduce peak energies to within ±0.035 eV. Relativistic corrections in selected area XPS instruments have been verified to ±0.05 eV. Instrument intensity-energy response functions can be defined between commercial instruments to within about 4%. XPS analyses have become more detailed as samples have become smaller, thinner, and more heterogeneous. XPS peak fitting is best performed when all available information about a sample is used, including its expected chemical and physical composition.
What is valence bond xps?3 answersValence bond XPS refers to the study of the valence band electronic structure using high-resolution X-ray photoelectron spectroscopy. This technique allows for the analysis of the energy levels and composition of the valence band in various materials. In the context of the provided abstracts, valence bond XPS was used to investigate the valence band structure of different compounds such as CmO2, Cs2UO2Cl4, vitreous silica (SiO2(vit)) and Na-silicate glasses, and binary chalcogenide vitreous semiconductors. The results of these studies provided insights into the nature of the chemical bonds, the participation of different atomic orbitals in the formation of valence molecular orbitals, and the effects of compositional changes on the electronic structure. Valence bond XPS is a valuable tool for understanding the electronic properties of materials and their chemical bonding.
What to do for XPS analysis of MXene materials?5 answersXPS analysis of MXene materials involves several steps. First, angle-resolved XPS combined with argon ion etching is used to characterize the surface functional groups and chemical structure of the MXene material. This technique allows for the identification of elements present on the sample surface, such as C, O, Ti, and F, as well as the determination of the location of these elements within the MXene structure. Additionally, thermal annealing can be used to investigate the transitions and thermal decomposition behavior of MXene samples. X-ray photoelectron spectroscopy (XPS) and two-dimensional correlation spectroscopy are employed to analyze the changes in the MXene structure during thermal annealing. Furthermore, XPS fitting models can be used to quantify surface terminations and overall chemistry of MXene materials. These models assign specific peaks in the XPS spectra to different surface terminations, such as C–Ti–O, C–Ti–F, and TiO2-xF2x. Overall, XPS analysis provides valuable information about the surface composition and structure of MXene materials, aiding in their characterization and the design of MXene-based materials with specific functionalities.
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