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Journal Article•DOI Failure Analysis of Composite Dielectric of Power Capacitors Used in Distribution Systems A. S. Farag, C. Wang, T.C. Cheng, G. Zheng, B. Palk, M. Moon - Show less +5 more 01 Feb 1999-Electric Machines and Power Systems 11 Citations	The results of the study of 2912 capacitor banks including 8736 capacitors installed at 153 distribution substations showed that the failure mode of capacitor units may be represented by Weibull distribution and each capacitor manufacturer has a diffe...
Book Chapter•DOI Characterization of Dielectric Films F. J. Feigl 01 Jan 1983-VLSI Electronics Microstructure Science 5 Citations	The MOS capacitor offers an incredibly powerful test structure for dielectric materials and conducting-solid–dielectric-solid interfaces.
Journal Article•DOI Functionality of the ferroelectric/oxide semiconductor interface J. T. Evans, Robert I. Suizu, Leonard L. Boyer - Show less +2 more 02 Jun 1997-Applied Surface Science 13 Citations	Since the device represents both a ferroelectric capacitor and a field effect transistor, specialized test procedures must be used to measure and understand all of the properties of a ferroelectric FET.
Journal Article•DOI Analysis of the effects of end connection quality on the dielectric loss of metallized film capacitors Xiaoguang Qi, Steven A. Boggs - Show less +1 more 01 Dec 2004-IEEE Transactions on Dielectrics and Electrical Insulation 13 Citations	This makes a low stress production test for end connection quality problematic since such tests can only show the total capacitor dissipation factor resulting from various factors.
Proceedings Article•DOI Testing the Fleischer-Laker switched-capacitor biquad using the diagnosis-after-test procedure Shao-Feng Hung, Long-Yi Lin, Hao-Chiao Hong - Show less +2 more 01 Dec 2012 9 Citations	In addition, the test achieves a 100% parametric fault coverage of the capacitor ratios defined by the SLB fault model for the Fleischer-Laker SC biquad.
Journal Article•DOI Metallized Film Power Capacitors End-of-Life Study Through Monitored Destruction Tests C. Guillermin, O. Dujeu, Jean-Marc Lupin - Show less +2 more 01 Jan 2013-IEEE Transactions on Power Delivery 14 Citations	It is shown herein that these defects in the windings of the capacitors have a wide range of electrical properties and the behavior of the capacitor in the test is strongly related to these properties.

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