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The fabricated transistors exhibit excellent I-V characteristics.
In addition, SETs have two unique features that conventional transistors do not have.
The results demonstrate a new scheme of building nanometer-scale transistors.
A new cell composed of a pair of adjacent gates provides high utilization of input transistors.
The devices have a measured cutoff frequency of 27 GHz, making them the fastest silicon p-n-p bipolar transistors reported to date.
It is found that single electron devices can have an operating temperature range similar to conventional silicon transistors, opening the door to hybrid designs.

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