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How much voltage can Arduino read? 

Superposition principle
Robustness (computer science)
Installation
Probability distribution
Voltage

Answers from top 7 papers

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Papers (7)Insight
Journal Article•DOI
Time-Based Sensing for Reference-Less and Robust Read in STT-MRAM Memories
Quang-Kien Trinh, Sergio Ruocco, Massimo Alioto 
21 May 2018-IEEE Transactions on Circuits and Systems I-regular Papers
20 Citations
The TBS scheme substantially improves the read yield compared to conventional voltage sensing (CVS).
Journal Article•DOI
Effect of Back-Gate Biasing on Floating Electrolytes in Silicon-on-Insulator-Based Nanoribbon Sensors
P. G. Fernandes, R. A. Chapman, Oliver Seitz, H. J. Stiegler, Huang-Chun Wen, Yves J. Chabal, Eric M. Vogel 
10 Jan 2012-IEEE Electron Device Letters
12 Citations
Real-time constant voltage sensing can thus be performed at much lower operating voltages.
Open access•Journal Article•DOI
Robust Intermediate Read-Out for Deep Submicron Technology CMOS Image Sensors
Chen Shoushun, Farid Boussaid, Amine Bermak 
08 Feb 2008-IEEE Sensors Journal
26 Citations
The proposed read-out scheme exhibits a relative insensitivity to the ongoing aggressive scaling of the supply voltage.
Journal Article•DOI
Impact of threshold voltage variation on 1S1R crossbar array with threshold switching selectors
Bing Song, Hui Xu, Haijun Liu, Qingjiang Li 
18 Apr 2017-Applied Physics A
19 Citations
We prove that large variation of threshold voltage may lead to unintentional writing during read process.
Proceedings Article•DOI
Estimation of customer voltages for planning of conservation voltage reduction
Olivia Leitermann, Vince Martinelli, James Simonelli 
26 Jul 2015
9 Citations
This yields a prediction of how many customers may require voltage mitigation for a particular CVR program.
Open access•Journal Article•DOI
Implementation of a Solution to the Problem of Dry-Band Arcing on ADSS Cables
Simon M. Rowland, O. de la Cerda, N R Haigh 
01 Jan 2007-IEEE Transactions on Power Delivery
8 Citations
This limit is somewhat arbitrary since, in polluted conditions, cables can fail at much lower system voltages, and in some higher voltage installations no problems have been witnessed.
Journal Article•DOI
Statistical Model for Random Telegraph Noise in Flash Memories
C. Monzio Compagnoni, R. Gusmeroli, Alessandro S. Spinelli, Andrea L. Lacaita, M. Bonanomi, Angelo Visconti 
01 Jan 2008-IEEE Transactions on Electron Devices
129 Citations
The results on the statistical distribution of the threshold-voltage difference between two subsequent read accesses show good agreement between measurements and model predictions, even considering the time drift of the distribution tails.

Related Questions

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