How to calibrate XPS spectra?
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We then were able to suggest integration limits that should be a useful guide in the determination of peak intensities for other XPS spectra. | |
17 Citations | Moreover our method gives an easy procedure to obtain the true primary excitation spectra for XPS and AES. |
34 Citations | It is demonstrated in this paper that its use can help in quantifying individual peak contributions to a multicomponent XPS spectrum. |
Practically, both the GLS and the GLP functions can be useful for XPS peak fitting. | |
32 Citations | These results are derived from intensity analysis of XPS spectra and are consistent with thermodynamic considerations. |
31 Citations | Our results provide a foundation that makes it possible to establish quantitative relationships between features of the XPS spectra and materials properties. |
The present results suggest several new assignments for the XPS spectra. | |
Our results suggest several new assignments for the XPS spectra. | |
69 Citations | This behaviour is shown to provide an additional basis for interpretation of XPS spectra |
Related Questions
What information can XPS give?5 answersXPS can provide information about the elemental composition of surfaces, including the chemical state of the elements, binding energy of electron states, thickness of layers near the surface, density of electronic states, and uniformity of elemental composition across the surface and as a function of depth. It can also yield information about the structure, surface termination, built-in electric potentials, and band offsets of films and heterostructures. XPS spectra can be used to identify chemical species at a surface through peak positions and shapes, and the intensities in the spectra can be used to obtain information on the concentration and distribution of chemical species. XPS features can provide insights into the properties and electronic structure of materials, and can be related to underlying chemical and physical phenomena.
Why does XPS only obtain the surface information?3 answersX-ray Photoelectron Spectroscopy (XPS) only obtains surface information because it is a surface analysis technique. XPS measures the kinetic energy of photoelectrons emitted from the surface of a material, providing information about the chemical composition and electronic structure of the surface. The technique is sensitive to the top few nanometers of the material, making it ideal for studying surface chemistry. However, XPS is limited to the surface because the photoelectrons have limited penetration depth and can only escape from the top layers of the material. Additionally, the surface oxidation and contamination can affect the chemical information obtained by XPS, highlighting the need for sample preparation and careful interpretation of the results. Overall, XPS is a valuable tool for studying surface properties, but it cannot provide information about the bulk composition or properties of a material.
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