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XPS results confirm that the amount of Si on the surface of the hybrids is higher than that in the bulk.
Our results show the wide applicability of high resolution XPS with hard x rays from a synchrotron source.
Thus, a combination of XPS and the other methods allows the XPS scaling constant to be determined with low uncertainty, traceable via the other methods.
Our results suggest that the SR-XPS system is useful for measuring the thickness of thin films.
Proceedings ArticleDOI
02 Mar 1987
10 Citations
The measurements of a 1 KW experimental dell and the number of its possible extensions demonstrate the versatility of this new magnetic structure as a controlled element in power-processing applications.
Second, we show that a simple model with few parameters can be easily adapted to each Dell platform rather than complex models which tends to use tricky hardware parameters.