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It is proposed that, assuming that the XPS peak at 187.1 eV is due to substitutional B (Bs), the e...
The present article confirms the preliminary results obtained by XPS.
The agreement with XPS results is satisfactory.
This article is the first in a series of guides assembled by a committee of experienced XPS practitioners that are intended to assist inexperienced users by providing information about good practices in the use of XPS.
Our results suggest several new assignments for the XPS spectra.
The present results suggest several new assignments for the XPS spectra.
XPS data might profitably provide such a means of comparison, although sufficiently reliable XPS data for commercial samples are not currently available.
The new XPS results are consistent with daily variations from the previous simple conversion technique used for XPS and are also consistent with spectral measurements made at wavelengths longer than 27 nm.
The calculated result reproduces the observed XPS result fairly well even at larger emission angles up to 80°, indicating that the accuracy of XPS depth profiling can be improved using the NIST database.