Which DMM test mode would be required to bench test transistors?
Answers from top 9 papers
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Papers (9) | Insight |
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15 Citations | The proposed methodology leads to high Defects Coverage (DC) and to relatively short test sequences, thus allowing low-energy operation in test mode. |
The improvements to the MMB test procedure include an improved method for calculating toughness from the measured test quantities, a more accurate way of setting the mixed-mode ratio to be tested, and the inclusion of a new alignment criterion for improved consistency in measured values. | |
The MMB test introduced in this paper is rather simple and is believed to offer several advantages over most current mixed-mode test. | |
08 Dec 2008 26 Citations | We describe a novel solution to address the manufacturing test of an MSMV/PSO design by using power-mode specifications to map multiple power modes to their target test modes and enhancing the DFT and ATPG methodology to enable a comprehensive test methodology. |
90 Citations | Efficient test schedules minimize the overall system test application time, avoid test resource conflicts, and limit power dissipation during test mode. |
04 Dec 2000 30 Citations | The implementation of the test mode is inherently low-cost and can be combined with previously proposed methods for an improved detection capability. |
29 Mar 2001 | In this paper, we present a new low power test-per-clock BIST test pattern generator that provides test vectors which can reduce the switching activity during test operation. |
07 Oct 2002 243 Citations | The technique has minimum impact on current design and test flows, and can be used to reduce test time, test data volume, test-I/O pins and tester channels, and also to improve test quality. |
47 Citations | A new test application strategy which applies the extra test vector to primary inputs while shifting out test responses for each scan chain, minimizes power dissipation by eliminating the spurious transitions which occur in the combinational part of the circuit. |